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dc.contributor.authorPanayiotou, Panayiotis A.en
dc.contributor.authorKaragrigoriou, Alexen
dc.creatorPanayiotou, Panayiotis A.en
dc.creatorKaragrigoriou, Alexen
dc.date.accessioned2019-12-02T10:37:15Z
dc.date.available2019-12-02T10:37:15Z
dc.date.issued2011
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/57356
dc.description.abstractThe aim of this work is the investigation of goodness of fit tests using measures of divergence. More specifically, we introduce a new family of divergence measures which is indexed by a positive parameter "a" and identify optimum values of "a" in order to improve the accuracy of the associated goodness of fit tests. © 2011 by IJAMAS, CESER Publications.en
dc.sourceInternational Journal of Applied Mathematics and Statisticsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79957869384&partnerID=40&md5=8670d4fc3611f2b9f9149e4a4d148cbb
dc.subjectTestingen
dc.subjectOptimizationen
dc.subjectGoodness-of-fit testen
dc.subjectDivergence measuresen
dc.subjectGoodness of fit testsen
dc.subjectOptimal testsen
dc.subjectOptimum valueen
dc.titleOptimal Φ-divergence testsel
dc.typeinfo:eu-repo/semantics/article
dc.description.volume24
dc.description.issueSUPPL. I-11Aen
dc.description.startingpage20
dc.description.endingpage29
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Μαθηματικών και Στατιστικής / Department of Mathematics and Statistics
dc.type.uhtypeArticleen
dc.description.notes<p>Cited By :2</p>en
dc.source.abbreviationInt.J.Appl.Math.Stat.en
dc.contributor.orcidKaragrigoriou, Alex [0000-0002-4919-2133]
dc.gnosis.orcid0000-0002-4919-2133


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