| dc.contributor.author | Christofides, Constantinos | en |
| dc.creator | Christofides, Constantinos | en |
| dc.date.accessioned | 2019-12-02T15:29:53Z | |
| dc.date.available | 2019-12-02T15:29:53Z | |
| dc.date.issued | 1998 | |
| dc.identifier.issn | 0167-9317 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/58581 | |
| dc.description.abstract | Abstract The non contact character of the photothermal technique makes it particularly attractive for the nondestructive evaluation of implanted materials. Photomodulated thermoreflectance (PMTR) can detect local variation in the reflectivity of the material caused by the modulated excursions of the surface temperature and plasma surface concentration. These measurements allow the estimation of certain characteristics such as local electronic, optical, and thermal parameters. In the case of implanted semiconductors, PMTR provides an indication of local degree of damage. " | en |
| dc.source | Electrical and Physical Characterization | en |
| dc.source.uri | http://www.sciencedirect.com/science/article/pii/S0167931798002755 | |
| dc.title | Photomodulated thermoreflectance investigation of semiconducting implanted wafers | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1016/S0167-9317(98)00275-5 | |
| dc.description.volume | 40 | |
| dc.description.issue | 3 | |
| dc.description.startingpage | 251 | |
| dc.description.endingpage | 261 | |
| dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
| dc.author.department | Τμήμα Φυσικής / Department of Physics | |
| dc.type.uhtype | Article | en |
| dc.description.notes | <p>ID: 271975</p> | en |
| dc.contributor.orcid | Christofides, Constantinos [0000-0002-4020-4660] | |
| dc.gnosis.orcid | 0000-0002-4020-4660 | |
