| dc.contributor.author | Christofides, Constantinos | en |
| dc.creator | Christofides, Constantinos | en |
| dc.date.accessioned | 2019-12-02T15:29:53Z | |
| dc.date.available | 2019-12-02T15:29:53Z | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/58582 | |
| dc.source | Semiconductors and Semimetals | en |
| dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-13044302065&doi=10.1016%2fS0080-8784%2808%2960107-6&partnerID=40&md5=46b6ede1b578442fe472d925dbaf8118 | |
| dc.title | Chapter 4 Photomodulated Thermoreflectance Investigation of Implanted Wafers. Annealing Kinetics of Defects | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1016/S0080-8784(08)60107-6 | |
| dc.description.volume | 46 | |
| dc.description.issue | C | en |
| dc.description.startingpage | 115 | |
| dc.description.endingpage | 150 | |
| dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
| dc.author.department | Τμήμα Φυσικής / Department of Physics | |
| dc.type.uhtype | Article | en |
| dc.description.notes | <p>Cited By :3</p> | en |
| dc.source.abbreviation | Semicond. Semimet. | en |
| dc.contributor.orcid | Christofides, Constantinos [0000-0002-4020-4660] | |
| dc.gnosis.orcid | 0000-0002-4020-4660 | |
