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dc.contributor.authorChristofides, Constantinosen
dc.creatorChristofides, Constantinosen
dc.date.accessioned2019-12-02T15:29:54Z
dc.date.available2019-12-02T15:29:54Z
dc.date.issued1993
dc.identifier.issn1040-8436
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58584
dc.description.abstractThis article reviews the history, background, theoretical basis, development, attempts to optimize, and experimental performance of the photopyroelectric technique for the optothermal characterization of advanced materials such as semiconductors, superconductors, pure metals and alloys, quantum wells, liquid crystals, paramagnetic and ferromagnetic materials, as well as solar cells. The state of the art in the experimental processes in this field is also reviewed. This new photothermal technique can be used after a careful optimization, as a highly sensitive method for photopyroelectric spectroscopy and general thermal wave measurements. It has been shown to be a highly sensitive spectroscopic method for the nondestructive evaluation of advanced materials. This review presents the main photopyroelectric theoretical models that have been used for the extraction of some important optoelectronic properties such as the optical absorption coefficient and the nonradiative quantum efficiency spectra, as well as some thermal properties such as the thermal diffusivity, thermal conductivity, and specific heat. The applicability of the general basic theoretical model with its many special cases is also described in detail. This review demonstrates how photopyroelectric spectroscopy can be complementary to the conventional spectroscopic methods. The different experimental modes of the technique are also discussed. Moreover, some ideas concerning future perspectives of applying the technique to other scientific fields are outlined. This article does not aspire to an in-depth analysis of the experimental results in the fielden
dc.description.abstractrather, it focuses on the technique itself.en
dc.sourceCritical Reviews in Solid State and Materials Sciencesen
dc.subjectABSORPTIONen
dc.subjectBA-CU-Oen
dc.subjectCONDENSED PHASESen
dc.subjectDEFLECTION SPECTROSCOPYen
dc.subjectEFFICIENCYen
dc.subjectHYDROGENATED AMORPHOUS-SILICONen
dc.subjectIMPULSE-RESPONSE DETECTIONen
dc.subjectPE DETECTORSen
dc.subjectPHOTOPYROELECTRIC TECHNIQUEen
dc.subjectPHOTOTHERMALen
dc.subjectPIEZOELECTRICITYen
dc.subjectPYROELECTRIC ANEMOMETERSen
dc.subjectSOLID FILMSen
dc.subjectTHIN-FILM INSTRUMENTATIONen
dc.titleThermal-Wave Photopyroelectric Characterization of Advanced Materials - State-Of-The-Arten
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1080/10408439308242559
dc.description.volume18
dc.description.issue2
dc.description.startingpage113
dc.description.endingpage174
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.description.notes<p>PT: Jen
dc.description.notesTC: 15en
dc.description.notesJ9: CRIT REV SOLID STATE</p>en
dc.source.abbreviationCrit.Rev.Solid State Mat.Sci.en
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0002-4020-4660


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