Out-of-Phase Photopyroelectric (PPE) Spectroscopy on Amorphous Semiconductors
Ημερομηνία
1992Source
Photoacoustic and Photothermal Phenomena IIIPages
417-419Google Scholar check
Metadata
Εμφάνιση πλήρους εγγραφήςΕπιτομή
Abstract A PPE spectrometer with self normalization capability has been used for both conventional transmission and thermal wave spectroscopic measurements of amorphous Si thin films, deposited on c—Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase photopyroelectric signal was established due to its zero-background compensation capability. Instrumental sensitivity limits of β t≈ 5× 10− 3 were demonstrated.