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Reconstruction Mechanisms in Ion Implanted and Annealed Silicon Wafers

dc.contributor.authorChristofides, Constantinosen
dc.contributor.authorSeas, Antoniosen
dc.contributor.authorOthonos, Andreas S.en
dc.creatorChristofides, Constantinosen
dc.creatorSeas, Antoniosen
dc.creatorOthonos, Andreas S.en
dc.date.accessioned2019-12-02T15:30:01Z
dc.date.available2019-12-02T15:30:01Z
dc.date.issued1995
dc.identifier.issn1662-9507
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58623
dc.sourceDefect and Diffusion Forumen
dc.source.urihttp://www.scientific.net/DDF.117-118.45
dc.subjectRaman Spectroscopyen
dc.subjectDefecten
dc.subjectFourier Transformen
dc.subjectIon Implantationen
dc.subjectKinetics of Annealingen
dc.subjectPhotothermal Reflectanceen
dc.subjectSpreading Resistanceen
dc.titleReconstruction Mechanisms in Ion Implanted and Annealed Silicon Wafersen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.4028/www.scientific.net/DDF.117-118.45
dc.description.volume117-118
dc.description.startingpage45
dc.description.endingpage64
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0003-0016-9116
dc.gnosis.orcid0000-0002-4020-4660


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