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Effect of disorder and defects in ion-implanted semiconductors : electrical and physico-chemical characterization

dc.contributor.authorGhibaudo, Gérarden
dc.contributor.authorChristofides, Constantinosen
dc.coverage.spatialSan Diegoen
dc.coverage.spatialLondonen
dc.creatorGhibaudo, Gérarden
dc.creatorChristofides, Constantinosen
dc.date.accessioned2019-12-02T15:30:23Z
dc.date.available2019-12-02T15:30:23Z
dc.date.issued1997
dc.identifier.isbn0-12-752145-3
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58695
dc.publisherAcademic Pressen
dc.source.urihttp://www.elsevier.com/journals
dc.subjectSemiconductorsen
dc.subjectIon implantationen
dc.titleEffect of disorder and defects in ion-implanted semiconductors : electrical and physico-chemical characterizationen
dc.typeinfo:eu-repo/semantics/book
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeBooken
dc.description.notes<p>Includes index.en
dc.description.notesIncludes bibliographical references and index.</p>en
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.description.totalnumpages300
dc.gnosis.orcid0000-0002-4020-4660


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