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Total Visits
| Views | |
|---|---|
| Non destructive photothermal radiometric measurements of defects and metallic contaminating impurities on silicon wafers : Crystalline defects and contamination : their impact and control in device manufacturing III | 93 |
Total Visits Per Month
| Ιανουάριος 2024 | Φεβρουάριος 2024 | Μάρτιος 2024 | Απρίλιος 2024 | Μάϊος 2024 | Ιούνιος 2024 | Ιούλιος 2024 | |
|---|---|---|---|---|---|---|---|
| Non destructive photothermal radiometric measurements of defects and metallic contaminating impurities on silicon wafers : Crystalline defects and contamination : their impact and control in device manufacturing III | 2 | 0 | 2 | 0 | 0 | 3 | 0 |
Top country views
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|---|---|
| Πολωνία | 50 |
| Ηνωμένες Πολιτείες | 18 |
| Ιρλανδία | 4 |
| Κύπρος | 2 |
| Γαλλία | 2 |
| Κολομβία | 1 |
| Κορέα, Νότια | 1 |
| Μαλαισία | 1 |
| Σουηδία | 1 |
| Τόγκο | 1 |
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| Warsaw | 50 |
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| San Mateo | 2 |
| Ann Arbor | 1 |
| Des Moines | 1 |