Non destructive photothermal radiometric measurements of defects and metallic contaminating impurities on silicon wafers : Crystalline defects and contamination : their impact and control in device manufacturing III

dc.contributor.author	Kolbesen, B. O.	en
dc.contributor.author	Electrochemical Society.	en
dc.contributor.author	European solid state device research conference (31st, : 2001 Sep	en
dc.contributor.author	Christofides, Constantinos	en
dc.creator	Kolbesen, B. O.	en
dc.creator	Electrochemical Society.	en
dc.creator	European solid state device research conference (31st, : 2001 Sep	en
dc.creator	Christofides, Constantinos	en
dc.date.accessioned	2019-12-02T15:31:31Z
dc.date.available	2019-12-02T15:31:31Z
dc.date.issued	2001
dc.identifier.isbn	1-56677-363-6
dc.identifier.uri	http://gnosis.library.ucy.ac.cy/handle/7/58786
dc.publisher	Electrochemical Society	en
dc.subject	contamination	en
dc.subject	crystalline defects	en
dc.subject	DECON	en
dc.subject	device manufacturing	en
dc.subject	ESSDERC	en
dc.subject	solid state device	en
dc.title	Non destructive photothermal radiometric measurements of defects and metallic contaminating impurities on silicon wafers : Crystalline defects and contamination : their impact and control in device manufacturing III	en
dc.type	info:eu-repo/semantics/book
dc.author.faculty	Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.department	Τμήμα Φυσικής / Department of Physics
dc.type.uhtype	Book	en
dc.contributor.orcid	Christofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid	0000-0002-4020-4660

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