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dc.contributor.authorLioudakis, Emmanouil E.en
dc.contributor.authorOthonos, Andreas S.en
dc.contributor.authorHadjisavvas, G. C.en
dc.contributor.authorKelires, P. C.en
dc.contributor.authorNassiopoulou, Androula Galiounaen
dc.creatorLioudakis, Emmanouil E.en
dc.creatorOthonos, Andreas S.en
dc.creatorHadjisavvas, G. C.en
dc.creatorKelires, P. C.en
dc.creatorNassiopoulou, Androula Galiounaen
dc.date.accessioned2019-12-02T15:31:47Z
dc.date.available2019-12-02T15:31:47Z
dc.date.issued2007
dc.identifier.issn1386-9477
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58844
dc.description.abstractSpectroscopic ellipsometry and Monte Carlo simulations are employed to answer the fundamental question whether the energy gaps of Si nanocrystals with sizes in the range of 3-5 nm, which are embedded in amorphous silica, follow or deviate from the quantum confinement model, and to examine their interfacial structure. It is shown that the optical properties of these nanocrystals are well described by the Forouhi-Bloomer interband model. Analysis of the optical measurements over a photon-energy range of 1.5-5 eV shows that the gap of embedded nanocrystals with a mean size of ∼3.9 nm follows closely quantum confinement theory. A large band gap expansion (∼0.65 eV) compared to bulk Si is observed. The Monte Carlo simulations reveal a non-abrupt interface and a large fraction of interface oxygen bonds. This, in conjunction with the experimental observations, indicates that oxygen states and the chemical disorder at the interface have a negligible influence on the optical properties of the material in this size regime. © 2007 Elsevier B.V. All rights reserved.en
dc.sourcePhysica E: Low-Dimensional Systems and Nanostructuresen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-34147101166&doi=10.1016%2fj.physe.2006.12.020&partnerID=40&md5=8ddde8603fe4cb46bb4b0342ed70976b
dc.subjectComputer simulationen
dc.subjectMonte Carlo methodsen
dc.subjectEnergy gapen
dc.subjectMonte Carlo simulationsen
dc.subjectOptical propertiesen
dc.subjectSiliconen
dc.subjectNanocrystalsen
dc.subjectSilicaen
dc.subjectSpectroscopic ellipsometryen
dc.subjectSilicon nanocrystalsen
dc.subjectAmorphous silicaen
dc.subjectQuantum confinementen
dc.subjectQuantum confinement modelsen
dc.titleQuantum confinement and interface structure of Si nanocrystals of sizes 3-5 nm embedded in a-SiO2en
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.physe.2006.12.020
dc.description.volume38
dc.description.issue1-2
dc.description.startingpage128
dc.description.endingpage134
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.source.abbreviationPhys Een
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.gnosis.orcid0000-0003-0016-9116


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