Determination of critical points on silicon nanofilms: Surface and quantum confinement effects
dc.contributor.author | Lioudakis, Emmanouil E. | en |
dc.contributor.author | Othonos, Andreas S. | en |
dc.contributor.author | Nassiopoulou, Androula Galiouna | en |
dc.creator | Lioudakis, Emmanouil E. | en |
dc.creator | Othonos, Andreas S. | en |
dc.creator | Nassiopoulou, Androula Galiouna | en |
dc.date.accessioned | 2019-12-02T15:31:48Z | |
dc.date.available | 2019-12-02T15:31:48Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 1862-6351 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/58847 | |
dc.description.abstract | In this work, we present a comprehensive study of the optical properties of nanocrystalline silicon films with thickness varied from 5 to 30 nm. Spectroscopic ellipsometry is employed to determine the dielectric functions of these films using a structural two-layer model based on the rigorous Airy formula. Our investigation gives an important insight of the origin of critical points for direct and indirect gaps of nanocrystalline silicon films as well as the evolution of them with decreasing the film thickness. The influence of the quantum confinement effect due to the nanoscale grain size and the surface vibrations at the interface on the optical properties are examined in detail. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA. | en |
dc.source | 3rd International Conference on Micro-Nanoelectronics, Nanotechnology and MEMs | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-57349196325&doi=10.1002%2fpssc.200780109&partnerID=40&md5=dbd879295c39fdb6d677fdafaf83e7ce | |
dc.subject | Equations of state | en |
dc.subject | Optical materials | en |
dc.subject | Optical properties | en |
dc.subject | Nanotechnology | en |
dc.subject | Silicon | en |
dc.subject | Metallic films | en |
dc.subject | Nanocrystalline alloys | en |
dc.subject | Nanocrystalline materials | en |
dc.subject | Spectroscopic ellipsometry | en |
dc.subject | Comprehensive studies | en |
dc.subject | Dielectric functions | en |
dc.subject | Nanocrystalline silicon | en |
dc.subject | Quantum confinement | en |
dc.subject | Airy formulas | en |
dc.subject | Critical points | en |
dc.subject | Layer models | en |
dc.subject | Nano films | en |
dc.subject | Nanocrystalline silicon films | en |
dc.subject | Nanoelectronics | en |
dc.subject | Nanoscale grains | en |
dc.subject | Quantum confinement effects | en |
dc.subject | Surface vibrations | en |
dc.title | Determination of critical points on silicon nanofilms: Surface and quantum confinement effects | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1002/pssc.200780109 | |
dc.description.volume | 5 | |
dc.description.issue | 12 | |
dc.description.startingpage | 3776 | |
dc.description.endingpage | 3779 | |
dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
dc.author.department | Τμήμα Φυσικής / Department of Physics | |
dc.type.uhtype | Article | en |
dc.description.notes | <p>Sponsors: NCSR Demokritos | en |
dc.description.notes | IMEL/NCSR Demokritos | en |
dc.description.notes | Micro and Nano Scientific Society | en |
dc.description.notes | FORTH-Crete | en |
dc.description.notes | University of Crete | en |
dc.description.notes | Conference code: 74503 | en |
dc.description.notes | Cited By :2</p> | en |
dc.source.abbreviation | Phys.Status Solidi C Curr.Top.Solid State Phys. | en |
dc.contributor.orcid | Othonos, Andreas S. [0000-0003-0016-9116] | |
dc.gnosis.orcid | 0000-0003-0016-9116 |
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