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Noncontact carrier lifetime depth profiling of ion-implanted Si using photothermal radiometry

dc.contributor.authorOthonos, Andreas S.en
dc.contributor.authorSalnick, Alexen
dc.contributor.authorMandelis, Andreasen
dc.contributor.authorChristofides, Constantinosen
dc.creatorOthonos, Andreas S.en
dc.creatorSalnick, Alexen
dc.creatorMandelis, Andreasen
dc.creatorChristofides, Constantinosen
dc.date.accessioned2019-12-02T15:32:12Z
dc.date.available2019-12-02T15:32:12Z
dc.date.issued1997
dc.identifier.isbn2-H
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58949
dc.sourcePhysica Status Solidi A-Applications and Materials Scienceen
dc.source.uri1862-6300
dc.titleNoncontact carrier lifetime depth profiling of ion-implanted Si using photothermal radiometryen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1002/1521-396X(199706)161:23.0.CO
dc.description.volume161
dc.description.issue2
dc.description.startingpageR13
dc.description.endingpageR14
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.description.notes<p>PT: Jen
dc.description.notesTC: 5en
dc.description.notesJ9: PHYS STATUS SOLIDI A</p>en
dc.source.abbreviationPhys.Status Solidi A-Appl.Mat.en
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0003-0016-9116
dc.gnosis.orcid0000-0002-4020-4660


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