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dc.contributor.authorPolikreti, Kyriakien
dc.contributor.authorChristofides, Constantinosen
dc.creatorPolikreti, Kyriakien
dc.creatorChristofides, Constantinosen
dc.date.accessioned2019-12-02T15:32:26Z
dc.date.available2019-12-02T15:32:26Z
dc.date.issued2006
dc.identifier.issn1296-2074
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/59006
dc.description.abstractAbstract: The subject of picture varnishes has concentrated the attention of numerous researchers from various scientific fields, during the last 15 years. Although several analytical chemistry techniques have been used in the field, information on the optical properties of picture varnishes is not extended. Most of the optical measurements on picture varnish refractive indexes, have been done by the immersion method (at 589 nm) while ageing studies are usually based on UV-Visible transmission curves. The aim of this paper is to present the potential of spectroscopic ellipsometry as a powerful tool in picture varnish studies. The main advantage of the technique is that it can measure refractive index, absorption coefficient and varnish thickness at the same time. Furthermore, it gives more reproducible and accurate results than traditional optical techniques, since relative instead of absolute values are measured. It is also very sensitive to surface roughness and thickness inhomogeneity. That is why it is more effective on Christian icons, which traditionally have very flat paint surfaces. Several examples on the application of the technique on fresh natural and synthetic varnishes (dammar, mastic and egg white, rosin and Paraloid B72) are presented in this work, showing the potential of the technique on varnish characterisation and alteration due to ageing. Copyright &y& Elsevier]en
dc.description.abstractCopyright of Journal of Cultural Heritage is the property of Elsevier Science Publishing Company, Inc. and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)en
dc.sourceJournal of Cultural Heritageen
dc.source.urihttp://search.ebscohost.com/login.aspx?direct=true&db=asn&AN=20187306&lang=el&site=ehost-live
dc.subjectRefractive indexen
dc.subjectSpectroscopic ellipsometryen
dc.subjectVarnishen
dc.subjectAbsorption coefficienten
dc.subjectAgeingen
dc.subjectCHRISTIAN antiquitiesen
dc.subjectCHRISTIAN art & symbolismen
dc.subjectCHRISTIANITY & arten
dc.subjectELLIPSOMETRYen
dc.subjectIconen
dc.subjectVARNISH & varnishingen
dc.titleSpectroscopic ellipsometry as a tool for the optical characterization and ageing studies of varnishes used in Post-Byzantine icon reconstructionsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.culher.2005.07.003
dc.description.volume7
dc.description.issue1
dc.description.startingpage30
dc.description.endingpage36
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0002-4020-4660


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