Show simple item record

Photothermal measurements on amorphous thin films deposited on crystalline silicon

dc.contributor.authorSeas, Antoniosen
dc.contributor.authorChristofides, Constantinosen
dc.contributor.authorMunidasa, M.en
dc.creatorSeas, Antoniosen
dc.creatorChristofides, Constantinosen
dc.creatorMunidasa, M.en
dc.date.accessioned2019-12-02T15:32:36Z
dc.date.available2019-12-02T15:32:36Z
dc.date.issued1996
dc.identifier.issn0003-6951
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/59039
dc.description.abstractNondestructive photothermal reflectance and radiometric measurements have been performed on amorphous silicon thin films of various thicknesses deposited on crystalline silicon substrate, The influence of the film thickness on the photothermal reflectance and radiometric signals (amplitude and phase) is shown. (C) 1996 American Institute of Physics.en
dc.sourceApplied Physics Lettersen
dc.subjectREFLECTANCEen
dc.titlePhotothermal measurements on amorphous thin films deposited on crystalline siliconen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1063/1.116392
dc.description.volume68
dc.description.issue4
dc.description.startingpage538
dc.description.endingpage540
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.description.notes<p>PT: Jen
dc.description.notesTC: 5en
dc.description.notesJ9: APPL PHYS LETT</p>en
dc.source.abbreviationAppl.Phys.Lett.en
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0002-4020-4660


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record