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Characterisation of the Reverse DC Resistance due to Potential Induced Degradation (PID) in Crystalline PV Cells

dc.contributor.authorGeorghiou, G. E.en
dc.contributor.authorMakrides, G.en
dc.contributor.authorLivera, A.en
dc.contributor.authorFlorides, M.en
dc.coverage.spatialMarseille, Franceen
dc.creatorGeorghiou, G. E.en
dc.creatorMakrides, G.en
dc.creatorLivera, A.en
dc.creatorFlorides, M.en
dc.date.accessioned2021-01-26T09:45:38Z
dc.date.available2021-01-26T09:45:38Z
dc.date.issued2019
dc.identifier.isbn978-3-936338-60-7
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/63322
dc.description.abstractPhotovoltaic Modules and BoS Components, PV Module Design, Manufacture, Performance and Reliability, Characterisation of the Reverse DC Resistance due to Potential Induced Degradation (PID) in Crystalline PV Cellsen
dc.language.isoenen
dc.publisherWIPen
dc.source36th European Photovoltaic Solar Energy Conference and Exhibitionen
dc.source.urihttp://www.eupvsec-proceedings.com/proceedings?paper=48257
dc.titleCharacterisation of the Reverse DC Resistance due to Potential Induced Degradation (PID) in Crystalline PV Cellsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.4229/EUPVSEC20192019-4AV.1.27
dc.description.startingpage1050
dc.description.endingpage1053
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidGeorghiou, G. E. [0000-0002-5872-5851]
dc.contributor.orcidMakrides, G. [0000-0002-0327-0386]
dc.contributor.orcidLivera, A. [0000-0002-3732-9171]
dc.contributor.orcidFlorides, M. [0000-0001-7543-5218]
dc.gnosis.orcid0000-0002-5872-5851
dc.gnosis.orcid0000-0002-0327-0386
dc.gnosis.orcid0000-0002-3732-9171
dc.gnosis.orcid0000-0001-7543-5218


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