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dc.contributor.authorFlorides, Michalisen
dc.contributor.authorMakrides, Georgeen
dc.contributor.authorGeorghiou, Georgeen
dc.coverage.spatialBrussels, Belgiumen
dc.creatorFlorides, Michalisen
dc.creatorMakrides, Georgeen
dc.creatorGeorghiou, Georgeen
dc.date.accessioned2021-01-26T09:45:39Z
dc.date.available2021-01-26T09:45:39Z
dc.date.issued2018
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/63335
dc.description.abstractThis paper examines the use of two different voltage measurement methods which could be used to detect Potential Induced Degradation (PID) in the field before any significant power loss occurs. The two methods are the open circuit voltage and the forward bias voltage measurement under light and dark conditions respectively. A theoretical analysis shows that the lower is the photocurrent or the forward bias current, the earlier PID can be detected. The experimental study of the aforementioned methods has validated the theoretical results and also revealed that the forward bias voltage method is a better and more accurate way to detect PID due to the controlled applied forward bias current. On the other hand, the measurement uncertainty of the pyranometer at low irradiance levels makes the open circuit voltage method a less promising technique for early PID detection.en
dc.source35th European PV Solar Energy Conference, EUPVSEC 2018, 24-28 Septemberen
dc.titleEarly potential induced degradation (PID) detection in the field: Cell shunt resistance characterisation at different degradation ratesen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidGeorghiou, George [0000-0002-5872-5851]
dc.contributor.orcidFlorides, Michalis [0000-0001-7543-5218]
dc.contributor.orcidMakrides, George [0000-0002-0327-0386]
dc.gnosis.orcid0000-0002-5872-5851
dc.gnosis.orcid0000-0001-7543-5218
dc.gnosis.orcid0000-0002-0327-0386


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