| dc.contributor.author | Chen, Jun | en |
| dc.contributor.author | Keroglou, Christoforos | en |
| dc.contributor.author | Hadjicostis, Christoforos N. | en |
| dc.contributor.author | Kumar, Ratnesh | en |
| dc.creator | Chen, Jun | en |
| dc.creator | Keroglou, Christoforos | en |
| dc.creator | Hadjicostis, Christoforos N. | en |
| dc.creator | Kumar, Ratnesh | en |
| dc.date.accessioned | 2021-01-26T09:46:00Z | |
| dc.date.available | 2021-01-26T09:46:00Z | |
| dc.date.issued | 2018 | |
| dc.identifier.issn | 1558-3783 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/63497 | |
| dc.description.abstract | This paper provides revisions to the algorithms presented by Chen et al., 2013 for testing diagnosability of stochastic discrete-event systems. Additional new contributions include PSPACE-hardness of verifying strong stochastic diagnosability (referred as A-Diagnosability in Thorsley et al., 2005) and a necessary and sufficient condition for testing stochastic diagnosability (referred as AA-Diagnosability in Thorsley et al., 2005) that involves a new notion of probabilistic equivalence. | en |
| dc.source | IEEE Transactions on Automation Science and Engineering | en |
| dc.title | Revised Test for Stochastic Diagnosability of Discrete-Event Systems | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1109/TASE.2016.2551746 | |
| dc.description.volume | 15 | |
| dc.description.issue | 1 | |
| dc.description.startingpage | 404 | |
| dc.description.endingpage | 408 | |
| dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
| dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
| dc.type.uhtype | Article | en |
| dc.contributor.orcid | Hadjicostis, Christoforos N. [0000-0002-1706-708X] | |
| dc.contributor.orcid | Keroglou, Christoforos [0000-0002-6461-439X] | |
| dc.gnosis.orcid | 0000-0002-1706-708X | |
| dc.gnosis.orcid | 0000-0002-6461-439X | |
