Correlative microscopy and spectroscopy of perovskite mini-modules: degradation analysis
Date
2023Author
Paraskeva, VasilikiPechmann, Sabrina
Fontanot, Tommaso
Aguirre, Aranzazu
Aernouts, Tom
Peraticos, Elias
Hadjipanayi, Maria
Sergides, Marios
Othonos, Andreas
Christiansen, Silke
Georghiou, George E.
Source
40th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2023)Google Scholar check
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Perovskite materials have excellent prospects for semiconducting applications due to their desirable photoelectric properties. The morphology and the structure of the light absorption layer are crucially important for the device performance and their changes through the degradation period are of upmost importance for understanding degradation pathways. In this work, pristine perovskite thin films with and without FACl additives in the active perovskite layer have been characterized with Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Energy-Dispersive Spectroscopy (EDX) to identify changes in the perovskite grain size, grain boundaries and current densities. Moreover, femtosecond transient transmission measurements have been employed to detect changes in carrier relaxation dynamics in encapsulated perovskite thin films before and after outdoor exposure.
Collections
- Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering [2897]
- Κέντρο Aριστείας για Έρευνα και Καινοτομία σε Ευφυείς, Αποδοτικές και Βιώσιμες Ενεργειακές Λύσεις «ΦΑΕΘΩΝ» / PHAETHON Research and Innovation Centre of Excellence for Intelligent, Efficient and Sustainable Energy Solutions [32]