Toggle navigation
English
Ελληνικά
English
English
Ελληνικά
Login
Toggle navigation
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Conference Object
Functions for quality transition fault tests
Date
2005
Author
Michael, Maria K.
Neophytou, S.
Tragoudas, S.
Source
Proceedings - International Symposium on Quality Electronic Design, ISQED
Proceedings - International Symposium on Quality Electronic Design, ISQED
Pages
327-332
Google Scholar check
Metadata
Show full item record
Links
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84886679995&doi=10.1109%2fISQED.2005.60&partnerID=40&md5=32b1f1eb5071a1cca040965bb96e1132
DOI
10.1109/ISQED.2005.60
URI
http://gnosis.library.ucy.ac.cy/handle/7/44218
Collections
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
[2897]
Cite as
APA
Vancouver
Harvard
BibTeX
Search Gnosis
This Collection
Browse
Everywhere
Communities & Collections
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
This Collection
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
My Account
Login
Statistics
View Usage Statistics