Browsing by Author "Bisson, M."
Now showing items 1-4 of 4
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Article
Optical Spectroscopy on Implanted and Annealed Silicon-Wafers - Plasma Resonance Wavelength
Christofides, Constantinos; Othonos, Andreas S.; Bisson, M.; Bousseysaid, J. (1994)A study of the effects of annealing temperature on phosphorus-implanted silicon films is carried out. Fourier transform infrared spectroscopy has been performed with two different instruments in the spectral ranges of ...
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Article
Quantitative Photopyroelectric Out-Of-Phase Spectroscopy of Amorphous-Silicon Thin-Films Deposited on Crystalline Silicon
Christofides, Constantinos; Mandelis, Andreas; ENGEL, A.; Bisson, M.; HARLING, G. (1991)A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline ...
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Article
Raman spectroscopy and spreading resistance analysis of phosphorus implanted and annealed silicon
Othonos, Andreas S.; Christofides, Constantinos; Boussey-Said, J.; Bisson, M. (1994)Raman and electrical characterization measurements are performed in order to study the effects of thermal annealing on phosphorus implanted silicon wafers. The silicon layers were implanted for various implantation energies ...
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Article
Raman-Spectroscopy and Spreading Resistance Analysis of Phosphorus Implanted and Annealed Silicon
Othonos, Andreas S.; Christofides, Constantinos; Bousseysaid, J.; Bisson, M. (1994)Raman and electrical characterization measurements are performed in order to study the effects of thermal annealing on phosphorus implanted silicon wafers. The silicon layers were implanted for various implantation energies ...