Browsing by Author "Bousseysaid, J."
Now showing items 1-3 of 3
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Article
Non-contacting measurements of photocarrier lifetimes in bulk- and polycrystalline thin-film Si photoconductive devices by photothermal radiometry
Mandelis, Andreas; Othonos, Andreas S.; Christofides, Constantinos; Bousseysaid, J. (1996)Laser-induced and frequency-scanned infrared photothermal radiometry was applied to a crystalline-Si photoconductive device, and to polysilicon thin-film photoconductors deposited on oxidized Si substrates by an LPCVD ...
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Article
Optical Spectroscopy on Implanted and Annealed Silicon-Wafers - Plasma Resonance Wavelength
Christofides, Constantinos; Othonos, Andreas S.; Bisson, M.; Bousseysaid, J. (1994)A study of the effects of annealing temperature on phosphorus-implanted silicon films is carried out. Fourier transform infrared spectroscopy has been performed with two different instruments in the spectral ranges of ...
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Article
Raman-Spectroscopy and Spreading Resistance Analysis of Phosphorus Implanted and Annealed Silicon
Othonos, Andreas S.; Christofides, Constantinos; Bousseysaid, J.; Bisson, M. (1994)Raman and electrical characterization measurements are performed in order to study the effects of thermal annealing on phosphorus implanted silicon wafers. The silicon layers were implanted for various implantation energies ...