Browsing by Author "Ndreu, L."

Now showing items 1-5 of 5

    • Conference Object  

      Eliminating energy of same-content-cell-columns of on-chip SRAM arrays 

      Ahsan, B.; Ndreu, L.; Sideris, I.; Sazeides, Yiannakis; Idgunji, S.; Özer, E. (2011)
      This work proposes to reduce energy by avoiding access to columns of on-chip SRAM arrays whose cell contents are all 1s or all 0s. We refer to this dynamic phenomenon as the Same-Cell-Content-Column (SCC-column). Analysis ...
    • Conference Object  

      HARPA: Tackling physically induced performance variability 

      Zompakis, Nikolaos; Noltsis, Michail; Ndreu, L.; Hadjilambrou, Zacharias; Englezakis, Panayiotis; Nikolaou, Panagiota; Portero, Antoni; Libutti, S.; Massari, Giuseppe; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Yiannakis; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, Dimitrios J. (Institute of Electrical and Electronics Engineers Inc., 2017)
      Continuously increasing application demands on both High Performance Computing (HPC) and Embedded Systems (ES) are driving the IC manufacturing industry on an everlasting scaling of devices in silicon. Nevertheless, ...
    • Conference Object  

      HARPA: Tackling physically induced performance variability 

      Zompakis, N.; Noltsis, M.; Ndreu, L.; Hadjilambrou, Z.; Englezakis, P.; Nikolaou, P.; Portero, A.; Libutti, S.; Massari, G.; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Y.; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, D. (2017)
    • Conference Object  

      Memory array protection: Check on read or check on write? 

      Nikolaou, Panagiota; Sazeides, Yiannakis; Ndreu, L.; Özer, E.; Idgunji, S. (2013)
      This work introduces Check-on-Write: a memory array error protection approach that enables a trade-off between a memory array's fault-coverage and energy. The presented approach checks for error in a value stored in an ...
    • Conference Object  

      Modeling the implications of DRAM failures and protection techniques on datacenter TCO 

      Nikolaou, Panagiota; Sazeides, Yiannakis; Ndreu, L.; Kleanthous, Marios M. (IEEE Computer Society, 2015)
      Total Cost of Ownership (TCO) is a key optimization metric for the design of a datacenter. This paper proposes, for the first time, a framework for modeling the implications of DRAM failures and DRAM error protection ...