Browsing by Author "Rodopoulos, Dimitrios"

Now showing items 1-4 of 4

    • Conference Object  

      Approximating standard cell delay distributions by reformulating the most probable failure point 

      Rodopoulos, Dimitrios; Roussel, P.; Catthoor, F.; Sazeides, Yiannakis; Soudris, Dimitrios J. (CEUR-WS, 2016)
      The delay distribution of a digital circuit path is crucial for the early reliability evaluation of a digital design. As transistors are shrunk to unprecedented dimensions, accurate yet fast estimation of such distributions ...
    • Conference Object  

      Fast Estimations of Failure Probability Over Long Time Spans 

      Noltsis, Michail; Englezakis, Panayiotis; Maragkoudaki, Eleni; Nicopoulos, Chrysostomos; Rodopoulos, Dimitrios; Catthoor, Francky; Sazeides, Yiannakis; Zoni, Davide; Soudris, Dimitrios (Association for Computing Machinery, 2018)
      Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that ...
    • Conference Object  

      Fast Estimations of Failure Probability Over Long Time Spans 

      Noltsis, Michail; Englezakis, Panayiotis; Maragkoudaki, Eleni; Nicopoulos, Chrysostomos; Rodopoulos, Dimitrios; Catthoor, Francky; Sazeides, Yiannakis; Zoni, Davide; Soudris, Dimitrios (Association for Computing Machinery, 2018)
      Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that ...
    • Conference Object  

      HARPA: Solutions for dependable performance under physically induced performance variability 

      Rodopoulos, Dimitrios; Corbetta, S.; Massari, Giuseppe; Libutti, S.; Catthoor, F.; Sazeides, Yiannakis; Nicopoulos, Chrysostomos A.; Portero, Antoni; Cappe, E.; Vavrík, R.; Vondrák, V.; Soudris, Dimitrios J.; Sassi, F.; Fritsch, A.; Fornaciari, W. (Institute of Electrical and Electronics Engineers Inc., 2015)
      Transistor miniaturization, combined with the dawn of novel switching semiconductor structures, calls for careful examination of the variability and aging of the computer fabric. Time-zero and time-dependent phenomena need ...