Browsing by Subject "Spectroscopic ellipsometry"

Article

Determination of critical points on silicon nanofilms: Surface and quantum confinement effects

Lioudakis, Emmanouil E.; Othonos, Andreas S.; Nassiopoulou, Androula Galiouna (2008)

In this work, we present a comprehensive study of the optical properties of nanocrystalline silicon films with thickness varied from 5 to 30 nm. Spectroscopic ellipsometry is employed to determine the dielectric functions ...

Article

Direct observation of excitons in polymer/carbon nanotube composites at room temperature: The influence of nanotube concentration

Lioudakis, Emmanouil E.; Kanari, C.; Othonos, Andreas S.; Alexandrou, Ioannis (2008)

In this work, we have employed spectroscopic ellipsometry technique to study the optical properties of polymer/carbon nanotube (CN) composites as a function of nanotube concentration. Using a two-layer structural model ...

Article

Ellipsometry on optically thin palladium films on silicon-based substrate: Effects of low concentration of hydrogen

Lioudakis, Emmanouil E.; Othonos, Andreas S. (2005)

Optically thin palladium films evaporated on silicon substrates are investigated following exposure to low concentrations of hydrogen gas in nitrogen using spectroscopic ellipsometry. Changes in the parameters tan Ψ and Δ ...

Article

Fine art painting characterization by spectroscopic ellipsometry: Preliminary measurements on varnish layers

Christofides, Constantinos; Castellon, B.; Othonos, Andreas S.; Polikreti, Kyriaki; De Deyne, C. (2004)

The long-term conservation of the original state of paintings requires high quality multi-spectral digital image technologies. CRISATEL Program addresses fine art professionals as primary end-users base. The analysis by ...

Article

Optical properties of polyelectrolyte quantum dot multilayer films prepared using the layer by layer self-assembly method

Lioudakis, Emmanouil E.; Koupanou, E.; Kanari, C.; Leontidis, Epameinondas; Othonos, Andreas S. (2008)

In this work, we have used spectroscopic ellipsometry to study the optical properties of polyelectrolyte-PbS quantum dot (QD) multilayer films prepared using the layer by layer self-assembly method. The optical results ...

Article

Organized silica films generated by evaporation-induced self-assembly as hosts for iron oxide nanoparticles

Andreou, Ioanna; Amenitsch, H.; Likodimos, Vlassis; Falaras, Polycarpos; Koutsoukos, Petros George; Leontidis, Epameinondas (2013)

In this work, we prepared oriented mesoporous thin films of silica on various solid substrates using the pluronic block copolymer P123 as a template. We attempted to insert guest iron oxide (FexOy) nanoparticles into these ...

Article

Quantum confinement and interface structure of Si nanocrystals of sizes 3-5 nm embedded in a-SiO2

Lioudakis, Emmanouil E.; Othonos, Andreas S.; Hadjisavvas, G. C.; Kelires, P. C.; Nassiopoulou, Androula Galiouna (2007)

Spectroscopic ellipsometry and Monte Carlo simulations are employed to answer the fundamental question whether the energy gaps of Si nanocrystals with sizes in the range of 3-5 nm, which are embedded in amorphous silica, ...

Article

Spectroscopic ellipsometry as a tool for the optical characterization and ageing studies of varnishes used in Post-Byzantine icon reconstructions

Polikreti, Kyriaki; Christofides, Constantinos (2006)

Abstract: The subject of picture varnishes has concentrated the attention of numerous researchers from various scientific fields, during the last 15 years. Although several analytical chemistry techniques have been used ...

Article

Study of the annealing kinetic effect and implantation energy on phosphorus-implanted silicon wafers using spectroscopic ellipsometry

Lioudakis, Emmanouil E.; Christofides, Constantinos; Othonos, Andreas S. (2006)

In this work, we have studied the changes in the optical properties on crystalline silicon implanted wafers (1 × 1013-1 × 1016 P+/cm2) using an extensive ellipsometric analysis. The effects of implantation energy (20-180 ...