• English
    • Ελληνικά
  • English 
    • English
    • Ελληνικά
  • Login
Browsing by Subject 
  •   Home
  • Browsing by Subject
  •   Home
  • Browsing by Subject
JavaScript is disabled for your browser. Some features of this site may not work without it.

Browsing by Subject "Spectroscopic ellipsometry"

  • 0-9
  • Α
  • Β
  • Γ
  • Δ
  • Ε
  • Ζ
  • Η
  • Θ
  • Ι
  • Κ
  • Λ
  • Μ
  • Ν
  • Ξ
  • Ο
  • Π
  • Ρ
  • Σ
  • Τ
  • Υ
  • Φ
  • Χ
  • Ψ
  • Ω
  • A
  • B
  • C
  • D
  • E
  • F
  • G
  • H
  • I
  • J
  • K
  • L
  • M
  • N
  • O
  • P
  • Q
  • R
  • S
  • T
  • U
  • V
  • W
  • X
  • Y
  • Z

Sort by:

Order:

Results:

Now showing items 1-9 of 9

  • title
  • submit date
  • accessioned date
  • ascending
  • descending
  • 5
  • 10
  • 20
  • 40
  • 60
  • 80
  • 100
    • Article  

      Determination of critical points on silicon nanofilms: Surface and quantum confinement effects 

      Lioudakis, Emmanouil E.; Othonos, Andreas S.; Nassiopoulou, Androula Galiouna (2008)
      In this work, we present a comprehensive study of the optical properties of nanocrystalline silicon films with thickness varied from 5 to 30 nm. Spectroscopic ellipsometry is employed to determine the dielectric functions ...

    • Article  

      Direct observation of excitons in polymer/carbon nanotube composites at room temperature: The influence of nanotube concentration 

      Lioudakis, Emmanouil E.; Kanari, C.; Othonos, Andreas S.; Alexandrou, Ioannis (2008)
      In this work, we have employed spectroscopic ellipsometry technique to study the optical properties of polymer/carbon nanotube (CN) composites as a function of nanotube concentration. Using a two-layer structural model ...

    • Article  

      Ellipsometry on optically thin palladium films on silicon-based substrate: Effects of low concentration of hydrogen 

      Lioudakis, Emmanouil E.; Othonos, Andreas S. (2005)
      Optically thin palladium films evaporated on silicon substrates are investigated following exposure to low concentrations of hydrogen gas in nitrogen using spectroscopic ellipsometry. Changes in the parameters tan Ψ and Δ ...

    • Article  

      Fine art painting characterization by spectroscopic ellipsometry: Preliminary measurements on varnish layers 

      Christofides, Constantinos; Castellon, B.; Othonos, Andreas S.; Polikreti, Kyriaki; De Deyne, C. (2004)
      The long-term conservation of the original state of paintings requires high quality multi-spectral digital image technologies. CRISATEL Program addresses fine art professionals as primary end-users base. The analysis by ...

    • Article  

      Optical properties of polyelectrolyte quantum dot multilayer films prepared using the layer by layer self-assembly method 

      Lioudakis, Emmanouil E.; Koupanou, E.; Kanari, C.; Leontidis, Epameinondas; Othonos, Andreas S. (2008)
      In this work, we have used spectroscopic ellipsometry to study the optical properties of polyelectrolyte-PbS quantum dot (QD) multilayer films prepared using the layer by layer self-assembly method. The optical results ...

    • Article  

      Organized silica films generated by evaporation-induced self-assembly as hosts for iron oxide nanoparticles 

      Andreou, Ioanna; Amenitsch, H.; Likodimos, Vlassis; Falaras, Polycarpos; Koutsoukos, Petros George; Leontidis, Epameinondas (2013)
      In this work, we prepared oriented mesoporous thin films of silica on various solid substrates using the pluronic block copolymer P123 as a template. We attempted to insert guest iron oxide (FexOy) nanoparticles into these ...

    • Article  

      Quantum confinement and interface structure of Si nanocrystals of sizes 3-5 nm embedded in a-SiO2 

      Lioudakis, Emmanouil E.; Othonos, Andreas S.; Hadjisavvas, G. C.; Kelires, P. C.; Nassiopoulou, Androula Galiouna (2007)
      Spectroscopic ellipsometry and Monte Carlo simulations are employed to answer the fundamental question whether the energy gaps of Si nanocrystals with sizes in the range of 3-5 nm, which are embedded in amorphous silica, ...

    • Article  

      Spectroscopic ellipsometry as a tool for the optical characterization and ageing studies of varnishes used in Post-Byzantine icon reconstructions 

      Polikreti, Kyriaki; Christofides, Constantinos (2006)
      Abstract: The subject of picture varnishes has concentrated the attention of numerous researchers from various scientific fields, during the last 15 years. Although several analytical chemistry techniques have been used ...

    • Article  

      Study of the annealing kinetic effect and implantation energy on phosphorus-implanted silicon wafers using spectroscopic ellipsometry 

      Lioudakis, Emmanouil E.; Christofides, Constantinos; Othonos, Andreas S. (2006)
      In this work, we have studied the changes in the optical properties on crystalline silicon implanted wafers (1 × 1013-1 × 1016 P+/cm2) using an extensive ellipsometric analysis. The effects of implantation energy (20-180 ...

      Browse

      EverywhereCommunities & CollectionsBy Submission DateAuthorsTitlesSubjectsBy TypeBy DepartmentBy Faculty

      My Account

      Login
      Πνευματικά δικαιώματα ©  Βιβλιοθήκη Πανεπιστημίου Κύπρου
      Contact Us | Send Feedback
      Οδηγίες κατάθεσης διδακτορικής διατριβής
      Open Access
      ORCiD