• Conference Object  

      Fast Estimations of Failure Probability Over Long Time Spans 

      Noltsis, Michail; Englezakis, Panayiotis; Maragkoudaki, Eleni; Nicopoulos, Chrysostomos; Rodopoulos, Dimitrios; Catthoor, Francky; Sazeides, Yiannakis; Zoni, Davide; Soudris, Dimitrios (Association for Computing Machinery, 2018)
      Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that ...