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Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
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Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
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Article
Foreword
Date
2016
Author
Khan, O.
Michael, Maria K.
Miele, A.
Qiaoyan, Y.
Source
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Issue
Journal Article
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Links
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84999277880&doi=10.1109%2fDFT.2016.7684056&partnerID=40&md5=17f5c8db56f167fe2df35bd917f6e57f
DOI
10.1109/DFT.2016.7684056
URI
http://gnosis.library.ucy.ac.cy/handle/7/43799
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Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
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