Toggle navigation
English
Ελληνικά
English
English
Ελληνικά
Login
Toggle navigation
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
007 Πολυτεχνική Σχολή / Faculty of Engineering
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Article
Function-based compact test pattern generation for path delay faults
Date
2005
Author
Michael, Maria K.
Tragoudas, S.
Source
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume
13
Issue
8
Pages
996-1001
Google Scholar check
Metadata
Show full item record
Links
https://www.scopus.com/inward/record.uri?eid=2-s2.0-27144527970&doi=10.1109%2fTVLSI.2005.853607&partnerID=40&md5=4566e32702cae8894da36f1709c68264
DOI
10.1109/TVLSI.2005.853607
URI
http://gnosis.library.ucy.ac.cy/handle/7/44220
Collections
Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
[2897]
Cite as
APA
Vancouver
Harvard
BibTeX
Search Gnosis
This Collection
Browse
Everywhere
Communities & Collections
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
This Collection
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
My Account
Login
Statistics
View Usage Statistics