dc.contributor.author | Voyiatzis, I. | en |
dc.contributor.author | Neophytou, S. | en |
dc.contributor.author | Michael, Maria K. | en |
dc.contributor.author | Hadjitheophanous, S. | en |
dc.contributor.author | Sgouropoulou, C. | en |
dc.contributor.author | Efstathiou, C. | en |
dc.creator | Voyiatzis, I. | en |
dc.creator | Neophytou, S. | en |
dc.creator | Michael, Maria K. | en |
dc.creator | Hadjitheophanous, S. | en |
dc.creator | Sgouropoulou, C. | en |
dc.creator | Efstathiou, C. | en |
dc.date.accessioned | 2019-04-08T07:48:40Z | |
dc.date.available | 2019-04-08T07:48:40Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/45070 | |
dc.source | IEEE Proc. of International Design and Test Symposium (IDT) | en |
dc.title | Test set Embedding in Accumulator-generated sequences targeting Hard-To-detect faults | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.description.startingpage | 1 | |
dc.description.endingpage | 2 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |