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Test set Embedding in Accumulator-generated sequences targeting Hard-To-detect faults

dc.contributor.authorVoyiatzis, I.en
dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.contributor.authorHadjitheophanous, S.en
dc.contributor.authorSgouropoulou, C.en
dc.contributor.authorEfstathiou, C.en
dc.creatorVoyiatzis, I.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.creatorHadjitheophanous, S.en
dc.creatorSgouropoulou, C.en
dc.creatorEfstathiou, C.en
dc.date.accessioned2019-04-08T07:48:40Z
dc.date.available2019-04-08T07:48:40Z
dc.date.issued2013
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/45070
dc.sourceIEEE Proc. of International Design and Test Symposium (IDT)en
dc.titleTest set Embedding in Accumulator-generated sequences targeting Hard-To-detect faultsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.description.startingpage1
dc.description.endingpage2
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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