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Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrate

dc.contributor.authorRai, S.en
dc.contributor.authorTiwari, M. K.en
dc.contributor.authorLodha, G. S.en
dc.contributor.authorModi, M. H.en
dc.contributor.authorChattopadhyay, M. K.en
dc.contributor.authorMajumdar, S.en
dc.contributor.authorGardelis, S.en
dc.contributor.authorViskadourakis, Z.en
dc.contributor.authorGiapintzakis, Johnen
dc.contributor.authorNandedkar, R. V.en
dc.contributor.authorRoy, S. B.en
dc.contributor.authorChaddah, P.en
dc.creatorRai, S.en
dc.creatorTiwari, M. K.en
dc.creatorLodha, G. S.en
dc.creatorModi, M. H.en
dc.creatorChattopadhyay, M. K.en
dc.creatorMajumdar, S.en
dc.creatorGardelis, S.en
dc.creatorViskadourakis, Z.en
dc.creatorGiapintzakis, Johnen
dc.creatorNandedkar, R. V.en
dc.creatorRoy, S. B.en
dc.creatorChaddah, P.en
dc.date.accessioned2019-05-06T12:24:24Z
dc.date.available2019-05-06T12:24:24Z
dc.date.issued2006
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48747
dc.description.abstractWe report a detailed study of surface and interface properties of pulsed-laser-deposited NiMnSb films on a Si(100) substrate as a function of film thickness. As the thickness of films is reduced below 35 nm, formation of a porous layer is observed. Porosity in this layer increases with decrease in NiMnSb film thickness. These morphological changes of the ultrathin films are reflected in the interesting transport and magnetic properties of these films. Compositional anomaly and surface and interface roughness are not the source of magnetic and transport properties of the films. © 2006 The American Physical Society.en
dc.language.isoengen
dc.sourcePhysical Review B - Condensed Matter and Materials Physicsen
dc.titleSurface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrateen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1103/PhysRevB.73.035417
dc.description.volume73
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidGiapintzakis, John [0000-0002-7277-2662]
dc.gnosis.orcid0000-0002-7277-2662


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