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Data storage applications based on LiCoO2 thin films grown on Al2O3 and Si substrates

dc.contributor.authorSvoukis, E.en
dc.contributor.authorMihailescu, C. N.en
dc.contributor.authorMai, V. H.en
dc.contributor.authorSchneegans, O.en
dc.contributor.authorBreza, K.en
dc.contributor.authorLioutas, C.en
dc.contributor.authorGiapintzakis, Johnen
dc.creatorSvoukis, E.en
dc.creatorMihailescu, C. N.en
dc.creatorMai, V. H.en
dc.creatorSchneegans, O.en
dc.creatorBreza, K.en
dc.creatorLioutas, C.en
dc.creatorGiapintzakis, Johnen
dc.date.accessioned2019-05-06T12:24:44Z
dc.date.available2019-05-06T12:24:44Z
dc.date.issued2015
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48887
dc.description.abstractIn this study, LiCoO2 thin films were investigated for data storage applications based on scanning probe mediated approaches. LiCoO2, compared to other materials proposed for scanning probe mediated nanoscale patterning, is highly stable and exhibits reversible electrochemical surface modifications. LiCoO2 thin films have been grown by pulsed laser deposition on Al2O3 and Si substrates over a range of deposition temperatures. The crystal structure and the microstructure of the films has been inferred through in- and out-of-plane X-ray diffraction studies and high-resolution transmission electron microscopy, respectively. The influence of the film deposition temperature on the surface electrical properties of the LiCoO2 films is discussed along with the relevant mechanism of surface resistance modification. © 2016 Elsevier B.V.en
dc.language.isoengen
dc.sourceApplied Surface Scienceen
dc.subjectAluminumen
dc.subjectCrystal structureen
dc.subjectPulsed laser depositionen
dc.subjectThin filmsen
dc.subjectX ray diffractionen
dc.subjectDepositionen
dc.subjectPulsed lasersen
dc.subjectHigh resolution transmission electron microscopyen
dc.subjectDigital storageen
dc.subjectDeposition temperaturesen
dc.subjectX-ray diffraction studiesen
dc.subjectStorage (materials)en
dc.subjectCP-AFMen
dc.subjectCrystal microstructureen
dc.subjectData storageen
dc.subjectData storage applicationsen
dc.subjectData storage equipmenten
dc.subjectElectrochemical surface modificationen
dc.subjectFilm deposition temperatureen
dc.subjectHR XRDen
dc.subjectLiCoO<sub>2</sub>en
dc.subjectLiCoO2en
dc.subjectLithographyen
dc.subjectNanoscale patterningen
dc.titleData storage applications based on LiCoO2 thin films grown on Al2O3 and Si substratesen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.apsusc.2016.02.177
dc.description.volume381
dc.description.startingpage22
dc.description.endingpage27
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidGiapintzakis, John [0000-0002-7277-2662]
dc.description.totalnumpages22-27
dc.gnosis.orcid0000-0002-7277-2662


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