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dc.contributor.authorUrazhdin, S.en
dc.contributor.authorBilc, D. I.en
dc.contributor.authorMahanti, S. D.en
dc.contributor.authorTessmer, S. H.en
dc.contributor.authorKyratsi, Theodoraen
dc.contributor.authorKanatzidis, M. G.en
dc.creatorUrazhdin, S.en
dc.creatorBilc, D. I.en
dc.creatorMahanti, S. D.en
dc.creatorTessmer, S. H.en
dc.creatorKyratsi, Theodoraen
dc.creatorKanatzidis, M. G.en
dc.date.accessioned2019-05-06T12:24:46Z
dc.date.available2019-05-06T12:24:46Z
dc.date.issued2004
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48910
dc.description.abstractScanning tunneling spectroscopy of Bi2Se3 and Bi2Te3 layered narrow gap semiconductors reveals finite in-gap density of states and suppressed conduction in the energy range of high valence-band states. Electronic structure calculations suggest that the surface effects are responsible for these properties. Conversely, the interlayer coupling has a strong effect on the bulk near-gap electronic structure. These properties may prove to be important for the thermoelectric performance of these and other related chalcogenides. © 2004 The American Physical Society.en
dc.language.isoengen
dc.sourcePhysical Review B - Condensed Matter and Materials Physicsen
dc.titleSurface effects in layered semiconductors Bi2Se3 and Bi2Te3en
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1103/PhysRevB.69.085313
dc.description.volume69
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidKyratsi, Theodora [0000-0003-2916-1708]
dc.gnosis.orcid0000-0003-2916-1708


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