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dc.contributor.authorAbella, J.en
dc.contributor.authorQuiñones, E.en
dc.contributor.authorCazorla, F. J.en
dc.contributor.authorValero, M.en
dc.contributor.authorSazeides, Yiannakisen
dc.creatorAbella, J.en
dc.creatorQuiñones, E.en
dc.creatorCazorla, F. J.en
dc.creatorValero, M.en
dc.creatorSazeides, Yiannakisen
dc.date.accessioned2019-11-13T10:38:09Z
dc.date.available2019-11-13T10:38:09Z
dc.date.issued2011
dc.identifier.isbn978-1-4577-1055-1
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/53481
dc.description.abstractTechnology and Vcc scaling lead to significant faulty bit rates in caches. Mechanisms based on disabling faulty parts show to be effective for average performance but are unacceptable in safety critical systems where worst-case execution time (WCET) estimations must be safe and tight. The Reliable Victim Cache (RVC) deals with this issue for a large fraction of the cache bits. However, replacement bits are not protected, thus keeping the probability of failure still high. This paper proposes two mechanisms to tolerate faulty bits in replacement bits and keep time-predictability by extending the RVC. Our solutions offer different tradeoffs between cost and complexity. In particular, the Extended RVC (ERVC) has low energy and area overheads while keeping complexity at a minimum. The Reliable Replacement Bits (RRB) solution has even lower overheads at the expense of some more wiring complexity. © 2011 IEEE.en
dc.sourceProceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011en
dc.source2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-80052732823&doi=10.1109%2fIOLTS.2011.5993806&partnerID=40&md5=8fc0b768788dc8f465d286e8cf3929df
dc.subjectArea overheaden
dc.subjectBit ratesen
dc.subjectLow energiesen
dc.subjectProbability of failureen
dc.subjectSafety critical systemsen
dc.subjectSafety testingen
dc.subjectWorst-case execution timeen
dc.titleRVC-based time-predictable faulty caches for safety-critical systemsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/IOLTS.2011.5993806
dc.description.startingpage25
dc.description.endingpage30
dc.author.faculty002 Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Πληροφορικής / Department of Computer Science
dc.type.uhtypeConference Objecten
dc.description.notes<p>Sponsors: IEEEen
dc.description.notesIEEE Computer Societyen
dc.description.notestttcen
dc.description.notesConference code: 86459en
dc.description.notesCited By :6</p>en


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