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dc.contributor.authorKaplanis, P. A.en
dc.contributor.authorPattichis, Constantinos S.en
dc.contributor.authorHadjileontiadis, L. J.en
dc.contributor.authorPanas, S. M.en
dc.creatorKaplanis, P. A.en
dc.creatorPattichis, Constantinos S.en
dc.creatorHadjileontiadis, L. J.en
dc.creatorPanas, S. M.en
dc.description.abstractThe objective of this ongoing study is to investigate whether or not Bispectral analysis (BS), a particular form of higher order spectra (HOS), may be utilized for analyzing the surface electromyographic signal (SEMG). The bicoherence index was used for characterizing the Gaussianity of the signal. Results indicate that SEMG signal distribution is highly non-Gaussian at low and high levels of force whereas the distribution has its maximum Gaussianity at the mid level of maximum voluntary contraction (MVC), i.e. at 50%. A measure of the linearity of the signal, based on deciding whether or not the estimated bicoherence is constant, follows the reverse pattern with the measure of Gaussianity. The power spectrum's (PS) median frequency, decreases from 105 to 93 Hz with increase of force, whereas the number of turns and the number of zero crosses increase with force. Further work is currently in progress in order to evaluate the usefulness of HOS in normal subjects and subjects suffering from neuromuscular disorders.en
dc.sourceProceedings of the Mediterranean Electrotechnical Conference - MELECONen
dc.source10th Mediterranean Electrotechnical Conference (MALECON2000)en
dc.subjectParameter estimationen
dc.subjectFrequency domain analysisen
dc.subjectSpectrum analysisen
dc.subjectDigital signal processingen
dc.subjectTime domain analysisen
dc.subjectData recordingen
dc.subjectSurface electromyographyen
dc.subjectMaximum voluntary contractionen
dc.subjectBispectral analysisen
dc.subjectPower spectrum analysisen
dc.titleBispectral analysis of surface EMGen
dc.description.endingpage773 Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied SciencesΤμήμα Πληροφορικής / Department of Computer Science
dc.type.uhtypeConference Objecten
dc.description.notes<p>Sponsors: IEEEen
dc.description.notesConference code: 57862en
dc.description.notesCited By :23</p>en
dc.contributor.orcidPattichis, Constantinos S. [0000-0003-1271-8151]

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