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dc.contributor.authorAnwar, M.en
dc.contributor.authorKhan, G. A.en
dc.contributor.authorHogarth, C. A.en
dc.contributor.authorTheocharis, Charis R.en
dc.creatorAnwar, M.en
dc.creatorKhan, G. A.en
dc.creatorHogarth, C. A.en
dc.creatorTheocharis, Charis R.en
dc.description.abstractThe infrared absorption spectra of vacuum-evaporated MoO3-In2O3 thin films are reported for a series of films of varying compositions within the spectral range 4000 to 400 cm-1 and interpreted in relation to the spectrum of the pure MoO3 films. The affects of changes in composition, film thickness, substrate deposition temperature and annealing on the absorption bands are observed. In some cases a shift in band frequency is also observed. The gradual increase in ordering and decrease in valency state with increase of annealing temperature is observed in the infrared curves. Some new peaks appear which reveal the presence of a lower valency state in MoO3. The shift in band frequency may be attributed to the incorporation of Mo(VI) ions in the indium interstitial positions. © 1989 Chapman and Hall Ltd.en
dc.sourceJournal of Materials Scienceen
dc.subjectHeat Treatment--Annealingen
dc.subjectIndium Oxideen
dc.subjectInfrared Propertiesen
dc.subjectMolybdenum Oxideen
dc.subjectSemiconducting Films--Amorphousen
dc.subjectSemiconductor Materialsen
dc.subjectThin Filmsen
dc.subjectValence Stateen
dc.titleInfrared spectra of some thin amorphous films of MoO3-In2O3 deposited by vacuum evaporationen
dc.description.endingpage4413 Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied SciencesΤμήμα Χημείας / Department of Chemistry
dc.description.notes<p>Cited By :4</p>en
dc.contributor.orcidTheocharis, Charis R. [0000-0002-1669-4954]

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