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Photothermal radiometric and spectroscopic measurements on silicon nitride thin films

dc.contributor.authorNestoros, Mariosen
dc.contributor.authorGutierrez-Llorente, A.en
dc.contributor.authorOthonos, Andreas S.en
dc.contributor.authorChristofides, Constantinosen
dc.contributor.authorMartinez-Duart, JMen
dc.creatorNestoros, Mariosen
dc.creatorGutierrez-Llorente, A.en
dc.creatorOthonos, Andreas S.en
dc.creatorChristofides, Constantinosen
dc.creatorMartinez-Duart, JMen
dc.date.accessioned2019-12-02T15:32:04Z
dc.date.available2019-12-02T15:32:04Z
dc.date.issued1997
dc.identifier.issn0021-8979
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58913
dc.description.abstractThin films of silicon nitride of various thicknesses, deposited by radio frequency magnetron sputtering on silicon quartz substrate, have been characterized by laser-induced and frequency scanned photothermal radiometry. Fourier transform infrared spectroscopy was also used to provide a qualitative description of the behavior of the films in the infrared range which shows favourable properties of these coatings to be used in passive cooling applications. (C) 1997 American Institute of Physics.en
dc.sourceJournal of Applied Physicsen
dc.titlePhotothermal radiometric and spectroscopic measurements on silicon nitride thin filmsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1063/1.366506
dc.description.volume82
dc.description.issue12
dc.description.startingpage6215
dc.description.endingpage6219
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.description.notes<p>PT: Jen
dc.description.notesTC: 7en
dc.description.notesJ9: J APPL PHYS</p>en
dc.source.abbreviationJ.Appl.Phys.en
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.contributor.orcidNestoros, Marios [0000-0002-2343-4771]
dc.contributor.orcidChristofides, Constantinos [0000-0002-4020-4660]
dc.gnosis.orcid0000-0003-0016-9116
dc.gnosis.orcid0000-0002-2343-4771
dc.gnosis.orcid0000-0002-4020-4660


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