Femtosecond carrier dynamics in In 2O 3 nanocrystals
dc.contributor.author | Othonos, Andreas S. | en |
dc.contributor.author | Zervos, Matthew | en |
dc.contributor.author | Tsokkou, Demetra | en |
dc.creator | Othonos, Andreas S. | en |
dc.creator | Zervos, Matthew | en |
dc.creator | Tsokkou, Demetra | en |
dc.date.accessioned | 2019-12-02T15:32:14Z | |
dc.date.available | 2019-12-02T15:32:14Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 1931-7573 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/58959 | |
dc.description.abstract | We have studied carrier dynamics in In 2O 3 nanocrystals grown on a quartz substrate using chemical vapor deposition. Transient differential absorption measurements have been employed to investigate the relaxation dynamics of photo-generated carriers in In 2O 3 nanocrystals. Intensity measurements reveal that Auger recombination plays a crucial role in the carrier dynamics for the carrier densities investigated in this study. A simple differential equation model has been utilized to simulate the photo-generated carrier dynamics in the nanocrystals and to fit the fluence-dependent differential absorption measurements. The average value of the Auger coefficient obtained from fitting to the measurements was γ = 5.9 ± 0.4 × 10 -31 cm 6 s -1. Similarly the average relaxation rate of the carriers was determined to be approximately τ = 110 ± 10 ps. Time-resolved measurements also revealed ~25 ps delay for the carriers to reach deep traps states which have a subsequent relaxation time of approximately 300 ps. | en |
dc.source | Nanoscale Research Letters | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-67649560791&doi=10.1007%2fs11671-009-9275-0&partnerID=40&md5=4a715b8a756e72f98603e57b1d8c5ea2 | |
dc.subject | Dynamics | en |
dc.subject | Absorption | en |
dc.subject | Oxide minerals | en |
dc.subject | Quartz | en |
dc.subject | Carrier dynamics | en |
dc.subject | Intensity measurements | en |
dc.subject | Photogenerated carriers | en |
dc.subject | Relaxation processes | en |
dc.subject | Absorption spectroscopy | en |
dc.subject | Auger recombination | en |
dc.subject | Augers | en |
dc.subject | Time resolved measurement | en |
dc.subject | Relaxation dynamics | en |
dc.subject | Femtosecond differential absorption spectroscopy | en |
dc.subject | Auger coefficient | en |
dc.subject | Average values | en |
dc.subject | Carrier density | en |
dc.subject | Deep traps | en |
dc.subject | Differential absorption | en |
dc.subject | Differential equation model | en |
dc.subject | Femtosecond | en |
dc.subject | Fluence | en |
dc.subject | In 2O 3 nanocrystals | en |
dc.subject | Nanocrystals | en |
dc.subject | Quartz substrate | en |
dc.subject | Relaxation rates | en |
dc.title | Femtosecond carrier dynamics in In 2O 3 nanocrystals | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1007/s11671-009-9275-0 | |
dc.description.volume | 4 | |
dc.description.issue | 6 | |
dc.description.startingpage | 526 | |
dc.description.endingpage | 531 | |
dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
dc.author.department | Τμήμα Φυσικής / Department of Physics | |
dc.type.uhtype | Article | en |
dc.description.notes | <p>Cited By :7</p> | en |
dc.source.abbreviation | Nanoscale Res.Lett. | en |
dc.contributor.orcid | Othonos, Andreas S. [0000-0003-0016-9116] | |
dc.contributor.orcid | Zervos, Matthew [0000-0002-6321-233X] | |
dc.gnosis.orcid | 0000-0003-0016-9116 | |
dc.gnosis.orcid | 0000-0002-6321-233X |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |