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dc.contributor.authorTsai, Din Pingen
dc.contributor.authorChung, Yueh L.en
dc.contributor.authorOthonos, Andreas S.en
dc.contributor.editorVaez-Iravani Mehdien
dc.creatorTsai, Din Pingen
dc.creatorChung, Yueh L.en
dc.creatorOthonos, Andreas S.en
dc.date.accessioned2019-12-02T15:34:36Z
dc.date.available2019-12-02T15:34:36Z
dc.date.issued1995
dc.identifier.isbn0-8194-1731-9
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/59175
dc.description.abstractApertured photon scanning tunneling microscopy (APSTM) was used to image the internal structure of an etched optical fiber with an intracore Bragg grating. Direct evidence of the subwavelength periodic variation of the index of refraction along the fiber is obtained by probing evanescent field intensity modulated by the etched fiber grating structure. The images we observed suggests local non-uniformity in the grating structure. Local anomalies appear in the values of the grating spacing. The modulation of the evanescent field intensity originates from variations in the index of refraction as well as from surface structure induced by etching of the fiber.en
dc.publisherSociety of Photo-Optical Instrumentation Engineersen
dc.sourceProceedings of SPIE - The International Society for Optical Engineeringen
dc.sourceScanning Probe Microscopies IIIen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0029222960&partnerID=40&md5=2fecd303353a977ac9c844b49b7e568e
dc.subjectRefractive indexen
dc.subjectFibersen
dc.subjectSurface phenomenaen
dc.subjectImaging techniquesen
dc.subjectBragg gratingen
dc.subjectEtchingen
dc.subjectApertured photon scanning tunneling microscopyen
dc.subjectScanning tunneling microscopyen
dc.subjectSubwavelength imagingen
dc.titleSubwavelength imaging of an etched fiber with an intracore Bragg grating by apertured photon scanning tunneling microscopeen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.description.volume2384
dc.description.startingpage191
dc.description.endingpage197
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeConference Objecten
dc.description.notes<p>Sponsors: SPIE - Int Soc for Opt Engineering, Bellingham, WA USAen
dc.description.notesConference code: 22219</p>en
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.gnosis.orcid0000-0003-0016-9116


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