Test set Embedding in Accumulator-generated sequences targeting Hard-To-detect faults
Date
2013Author
Voyiatzis, I.Neophytou, S.
Michael, Maria K.
Hadjitheophanous, S.
Sgouropoulou, C.
Efstathiou, C.
Source
IEEE Proc. of International Design and Test Symposium (IDT)Pages
1-2Google Scholar check