Browsing by Author "Catthoor, F."

Now showing items 1-6 of 6

    • Conference Object  

      Approximating standard cell delay distributions by reformulating the most probable failure point 

      Rodopoulos, Dimitrios; Roussel, P.; Catthoor, F.; Sazeides, Yiannakis; Soudris, Dimitrios J. (CEUR-WS, 2016)
      The delay distribution of a digital circuit path is crucial for the early reliability evaluation of a digital design. As transistors are shrunk to unprecedented dimensions, accurate yet fast estimation of such distributions ...
    • Conference Object  

      HARPA: Solutions for dependable performance under physically induced performance variability 

      Rodopoulos, Dimitrios; Corbetta, S.; Massari, Giuseppe; Libutti, S.; Catthoor, F.; Sazeides, Yiannakis; Nicopoulos, Chrysostomos A.; Portero, Antoni; Cappe, E.; Vavrík, R.; Vondrák, V.; Soudris, Dimitrios J.; Sassi, F.; Fritsch, A.; Fornaciari, W. (Institute of Electrical and Electronics Engineers Inc., 2015)
      Transistor miniaturization, combined with the dawn of novel switching semiconductor structures, calls for careful examination of the variability and aging of the computer fabric. Time-zero and time-dependent phenomena need ...
    • Conference Object  

      HARPA: Solutions for dependable performance under physically induced performance variability 

      Rodopoulos, D.; Corbetta, S.; Massari, G.; Libutti, S.; Catthoor, F.; Sazeides, Y.; Nicopoulos, Chrysostomos A.; Portero, A.; Cappe, E.; Vavrik, R.; Vondrák, V.; Soudris, D.; Sassi, F.; Fritsch, A.; Fornaciari, W. (2015)
    • Conference Object  

      HARPA: Tackling physically induced performance variability 

      Zompakis, Nikolaos; Noltsis, Michail; Ndreu, L.; Hadjilambrou, Zacharias; Englezakis, Panayiotis; Nikolaou, Panagiota; Portero, Antoni; Libutti, S.; Massari, Giuseppe; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Yiannakis; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, Dimitrios J. (Institute of Electrical and Electronics Engineers Inc., 2017)
      Continuously increasing application demands on both High Performance Computing (HPC) and Embedded Systems (ES) are driving the IC manufacturing industry on an everlasting scaling of devices in silicon. Nevertheless, ...
    • Conference Object  

      HARPA: Tackling physically induced performance variability 

      Zompakis, N.; Noltsis, M.; Ndreu, L.; Hadjilambrou, Z.; Englezakis, P.; Nikolaou, P.; Portero, A.; Libutti, S.; Massari, G.; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Y.; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, D. (2017)
    • Conference Object  

      Sensitivity of SRAM Cell Most Probable SNM Failure Point to Time-Dependent Variability 

      Rodopoulos, D.; Sazeides, Y.; Catthoor, F.; Nicopoulos, Chrysostomos A.; Soudris, D. (2015)