Browsing by Subject "Reliability"
Now showing items 1-20 of 21
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Conference Object
Approximating standard cell delay distributions by reformulating the most probable failure point
(CEUR-WS, 2016)The delay distribution of a digital circuit path is crucial for the early reliability evaluation of a digital design. As transistors are shrunk to unprecedented dimensions, accurate yet fast estimation of such distributions ...
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Article
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Conference Object
Comparison of tree and straight-line clocking for long systolic arrays
(Publ by IEEE, 1991)Achieving efficient and reliable synchronization is a critical problem in building long systolic arrays. This problem is addressed in the context of synchronous systems by introducing probabilistic models for two alternative ...
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Article
Design under uncertainty and assessment of performance reliability of a dual-use medium truck with hydraulic-hybrid powertrain and fuel cell auxiliary power unit
(2005)Medium trucks constitute a large market segment of the commercial transportation sector, and are also used widely for military tactical operations. Recent technological advances in hybrid powertrains and fuel cell auxiliary ...
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Conference Object
Designing mechanisms for reliable internet-based computing
(2008)In this work, using a game-theoretic approach, cost-sensitive mechanisms that lead to reliable Internet-based computing are designed. In particular, we consider Internet-based master-worker computations, where a master ...
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Designs of bisimilar Petri net controllers with fault tolerance capabilities
(2008)This paper proposes an approach for providing tolerance against faults that may compromise the functionality of a given controller modeled by a Petri net. The method is based on embedding the given Petri net controller ...
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Article
Dimensionality of coping: An empirical contribution to the construct validation of the Brief-COPE with a Greek-speaking sample
(2010)The construct of coping has received increasing attention over the past years in relation to psychological and physical health, yet its dimensional and conceptual understanding is not consistent across theoretical models. ...
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Article
Fault-tolerant semifast implementations of atomic read/write registers
(2009)This paper investigates time-efficient implementations of atomic read-write registers in message-passing systems where the number of readers can be unbounded. In particular we study the case of a single writer, multiple ...
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Article
Greek EPQ-J: Further support for a three-factor model of personality in children and adolescents
(2010)This study aimed to investigate the validity of the Eysenckian personality dimensions in 1,368 children and adolescents who completed the Greek Eysenck Personality Questionnaire-Junior (EPQ-J). Exploratory and confirmatory ...
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A maximum entropy type test of fit
(2011)In this paper, we propose a test of fit based on maximum entropy. The asymptotic distribution of the proposed test statistic is established and a corrected form for small and medium sample sizes is furnished. The performance ...
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Modeling the impact of permanent faults in caches
(2013)The traditional performance cost benefits we have enjoyed for decades from technology scaling are challenged by several critical constraints including reliability. Increases in static and dynamic variations are leading to ...
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Conference Object
On semi-markov modelling and inference for multi-state systems
(Institute of Electrical and Electronics Engineers Inc., 2016)In this work we focus on multi state systems that we model by means of semi-Markov processes. The sojourn times are seen to be independent not identically distributed random variables and assumed to belong to a general ...
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On the robustness of (semi) fast quorum-based implementations of atomic shared memory
(2008)This paper studies a trade-off between fault-tolerance and latency in implementations of atomic read/write objects in message-passing systems. In particular, considering fast or semifast quorum-based implementations, that ...
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Conference Object
Semi-Markov modelling for multi-state systems
(Institute of Electrical and Electronics Engineers Inc., 2014)Markov processes are widely used in reliability engineering. In this work we focus on multi state systems (MSS) and apply the Semi-Markov methodology for parameter estimation. For this purpose the sojourn times are assumed ...
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Conference Object
Soft-decision decoding of linear block codes using multiple information bases
(2003)A previous study addressed algorithms that perform soft-decision decoding by utilizing encodings of test error patterns (TEPs) on the so-called "most reliable basis" which can be obtained by a greedy search algorithm. In ...
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Article
Statistical comparison of algorithms
(2004)A "reference" algorithm or instrument and its various "distortions" are considered, where the distortions carry some valid information about the reference. The objective is to combine data from the reference and the ...
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Conference Object
Statistical inference for heavy-tailed distributions in technical systems
(Institute of Electrical and Electronics Engineers Inc., 2014)In this work we explore the class of heavy-tailed distributions and discuss their signicance in reliability engineering. At the same time we discuss measures of divergence which are extensively used in statistics in various ...
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A Study of Thread Migration in Temperature-Constrained Multicores
(2007)Temperature has become an important constraint in high-performance processors, especially multicores. Thread migration will be essential to exploit the full potential of future thermally constrained multicores.We propose ...
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Conference Object
The TERAFLUX project: Exploiting the dataflow paradigm in next generation teradevices
(2013)Thanks to the improvements in semiconductor technologies, extreme-scale systems such as teradevices (i.e., composed by 1000 billion of transistors) will enable systems with 1000+ general purpose cores per chip, probably ...
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Article
TERAFLUX: Harnessing dataflow in next generation teradevices
(2014)The improvements in semiconductor technologies are gradually enabling extreme-scale systems such as teradevices (i.e., chips composed by 1000 billion of transistors), most likely by 2020. Three major challenges have been ...