Electron microscopy study of thermoelectric (BixSb1-x)2Te3thin film
Lioutas, C. B.
PublisherSpringer Science and Business Media, LLC
SourceSpringer Proceedings in Physics
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In the present work, transmission electron microscopy (TEM) techniques were used in order to study the morphology and investigate the structural properties of a (BixSb1-x)2Te3(BST) thin film. The sample was fabricated on silicon substrate by pulsed laser deposition (PLD) method. Towards this aim, cross sectional and planar view samples were prepared, suitable for High Resolution Electron Microscopy. Results revealed a polycrystalline, c-axis oriented film with coherent boundaries between neighboring columnar grains. © Springer International Publishing Switzerland 2015.
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