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Electron microscopy study of thermoelectric (BixSb1-x)2Te3thin film

dc.contributor.authorBreza, A.en
dc.contributor.authorLioutas, C. B.en
dc.contributor.authorGiapintzakis, Johnen
dc.contributor.editorPolychroniadis, E. K.en
dc.contributor.editorA.Y, Oralen
dc.contributor.editorM, Ozeren
dc.creatorBreza, A.en
dc.creatorLioutas, C. B.en
dc.creatorGiapintzakis, Johnen
dc.date.accessioned2019-05-06T12:23:25Z
dc.date.available2019-05-06T12:23:25Z
dc.date.issued2015
dc.identifier.isbn978-3-319-16918-7
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48263
dc.description.abstractIn the present work, transmission electron microscopy (TEM) techniques were used in order to study the morphology and investigate the structural properties of a (BixSb1-x)2Te3(BST) thin film. The sample was fabricated on silicon substrate by pulsed laser deposition (PLD) method. Towards this aim, cross sectional and planar view samples were prepared, suitable for High Resolution Electron Microscopy. Results revealed a polycrystalline, c-axis oriented film with coherent boundaries between neighboring columnar grains. © Springer International Publishing Switzerland 2015.en
dc.language.isoengen
dc.publisherSpringer Science and Business Media, LLCen
dc.sourceSpringer Proceedings in Physicsen
dc.subjectPulsed laser depositionen
dc.subjectThin filmsen
dc.subjectPolycrystallineen
dc.subjectTransmission electron microscopyen
dc.subjectC-axis oriented filmen
dc.subjectCoherent boundariesen
dc.subjectColumnar grainen
dc.subjectElectron microscopyen
dc.subjectElectron probe microanalysisen
dc.subjectHigh resolution electron microscopyen
dc.subjectHigh resolution transmission electron microscopyen
dc.subjectMicroanalysisen
dc.subjectSilicon substratesen
dc.titleElectron microscopy study of thermoelectric (BixSb1-x)2Te3thin filmen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1007/978-3-319-16919-4_1
dc.description.volume164
dc.description.startingpage3
dc.description.endingpage7
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidGiapintzakis, John [0000-0002-7277-2662]
dc.description.totalnumpages3-7
dc.gnosis.orcid0000-0002-7277-2662


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