Electron microscopy study of thermoelectric (BixSb1-x)2Te3thin film
dc.contributor.author | Breza, A. | en |
dc.contributor.author | Lioutas, C. B. | en |
dc.contributor.author | Giapintzakis, John | en |
dc.contributor.editor | Polychroniadis, E. K. | en |
dc.contributor.editor | A.Y, Oral | en |
dc.contributor.editor | M, Ozer | en |
dc.creator | Breza, A. | en |
dc.creator | Lioutas, C. B. | en |
dc.creator | Giapintzakis, John | en |
dc.date.accessioned | 2019-05-06T12:23:25Z | |
dc.date.available | 2019-05-06T12:23:25Z | |
dc.date.issued | 2015 | |
dc.identifier.isbn | 978-3-319-16918-7 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48263 | |
dc.description.abstract | In the present work, transmission electron microscopy (TEM) techniques were used in order to study the morphology and investigate the structural properties of a (BixSb1-x)2Te3(BST) thin film. The sample was fabricated on silicon substrate by pulsed laser deposition (PLD) method. Towards this aim, cross sectional and planar view samples were prepared, suitable for High Resolution Electron Microscopy. Results revealed a polycrystalline, c-axis oriented film with coherent boundaries between neighboring columnar grains. © Springer International Publishing Switzerland 2015. | en |
dc.language.iso | eng | en |
dc.publisher | Springer Science and Business Media, LLC | en |
dc.source | Springer Proceedings in Physics | en |
dc.subject | Pulsed laser deposition | en |
dc.subject | Thin films | en |
dc.subject | Polycrystalline | en |
dc.subject | Transmission electron microscopy | en |
dc.subject | C-axis oriented film | en |
dc.subject | Coherent boundaries | en |
dc.subject | Columnar grain | en |
dc.subject | Electron microscopy | en |
dc.subject | Electron probe microanalysis | en |
dc.subject | High resolution electron microscopy | en |
dc.subject | High resolution transmission electron microscopy | en |
dc.subject | Microanalysis | en |
dc.subject | Silicon substrates | en |
dc.title | Electron microscopy study of thermoelectric (BixSb1-x)2Te3thin film | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.identifier.doi | 10.1007/978-3-319-16919-4_1 | |
dc.description.volume | 164 | |
dc.description.startingpage | 3 | |
dc.description.endingpage | 7 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Giapintzakis, John [0000-0002-7277-2662] | |
dc.description.totalnumpages | 3-7 | |
dc.gnosis.orcid | 0000-0002-7277-2662 |
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