In situ observation of rapid reactions in nanoscale Ni-Al multilayer foils using synchrotron radiation
Date
2010Author
Fadenberger, K.Gunduz, Ibrahim Emre
Tsotsos, Chrysostomos
Kokonou, Maria
Gravani, S.
Brandstetter, Stefan
Bergamaschi, Anna
Schmitt, Bernd
Mayrhofer, Paul H.
Doumanidis, C. C.
Rebholz, Claus
Source
Applied Physics LettersVolume
97Google Scholar check
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The observation of rapid reactions in nanoscale multilayers present challenges that require sophisticated analysis methods. We present high-resolution in situ x-ray diffraction analysis of reactions in nanoscale foils of Ni0.9V0.1-Al using the Mythen II solid-state microstrip detector system at the Material Science beamline of the Swiss Light Source Synchrotron at Paul Scherrer Institute in Villigen, Switzerland. The results reveal the temperature evolution corresponding to the rapid formation of NiAl intermetallic phase, vanadium segregation and formation of stresses during cooling, determined at high temporal (0.125 ms) and angular (0.004°) resolution over a full angular range of 120°. ABSTRACT FROM AUTHOR] Copyright of Applied Physics Letters is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)