dc.contributor.author | Fadenberger, K. | en |
dc.contributor.author | Gunduz, Ibrahim Emre | en |
dc.contributor.author | Tsotsos, Chrysostomos | en |
dc.contributor.author | Kokonou, Maria | en |
dc.contributor.author | Gravani, S. | en |
dc.contributor.author | Brandstetter, Stefan | en |
dc.contributor.author | Bergamaschi, Anna | en |
dc.contributor.author | Schmitt, Bernd | en |
dc.contributor.author | Mayrhofer, Paul H. | en |
dc.contributor.author | Doumanidis, C. C. | en |
dc.contributor.author | Rebholz, Claus | en |
dc.creator | Fadenberger, K. | en |
dc.creator | Gunduz, Ibrahim Emre | en |
dc.creator | Tsotsos, Chrysostomos | en |
dc.creator | Kokonou, Maria | en |
dc.creator | Gravani, S. | en |
dc.creator | Brandstetter, Stefan | en |
dc.creator | Bergamaschi, Anna | en |
dc.creator | Schmitt, Bernd | en |
dc.creator | Mayrhofer, Paul H. | en |
dc.creator | Doumanidis, C. C. | en |
dc.creator | Rebholz, Claus | en |
dc.date.accessioned | 2019-05-06T12:23:33Z | |
dc.date.available | 2019-05-06T12:23:33Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48332 | |
dc.description.abstract | The observation of rapid reactions in nanoscale multilayers present challenges that require sophisticated analysis methods. We present high-resolution in situ x-ray diffraction analysis of reactions in nanoscale foils of Ni0.9V0.1-Al using the Mythen II solid-state microstrip detector system at the Material Science beamline of the Swiss Light Source Synchrotron at Paul Scherrer Institute in Villigen, Switzerland. The results reveal the temperature evolution corresponding to the rapid formation of NiAl intermetallic phase, vanadium segregation and formation of stresses during cooling, determined at high temporal (0.125 ms) and angular (0.004°) resolution over a full angular range of 120°. ABSTRACT FROM AUTHOR] | en |
dc.description.abstract | Copyright of Applied Physics Letters is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | en |
dc.source | Applied Physics Letters | en |
dc.subject | Chemical reactions | en |
dc.subject | Intermetallic compounds | en |
dc.subject | Light sources | en |
dc.subject | Metal foils | en |
dc.subject | Multilayered thin films | en |
dc.subject | Nickel-aluminum alloys | en |
dc.subject | Synchrotron radiation | en |
dc.subject | X-ray diffraction | en |
dc.title | In situ observation of rapid reactions in nanoscale Ni-Al multilayer foils using synchrotron radiation | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1063/1.3485673 | |
dc.description.volume | 97 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
dc.type.uhtype | Article | en |
dc.description.totalnumpages | 144101 | |