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dc.contributor.authorFadenberger, K.en
dc.contributor.authorGunduz, Ibrahim Emreen
dc.contributor.authorTsotsos, Chrysostomosen
dc.contributor.authorKokonou, Mariaen
dc.contributor.authorGravani, S.en
dc.contributor.authorBrandstetter, Stefanen
dc.contributor.authorBergamaschi, Annaen
dc.contributor.authorSchmitt, Bernden
dc.contributor.authorMayrhofer, Paul H.en
dc.contributor.authorDoumanidis, C. C.en
dc.contributor.authorRebholz, Clausen
dc.creatorFadenberger, K.en
dc.creatorGunduz, Ibrahim Emreen
dc.creatorTsotsos, Chrysostomosen
dc.creatorKokonou, Mariaen
dc.creatorGravani, S.en
dc.creatorBrandstetter, Stefanen
dc.creatorBergamaschi, Annaen
dc.creatorSchmitt, Bernden
dc.creatorMayrhofer, Paul H.en
dc.creatorDoumanidis, C. C.en
dc.creatorRebholz, Clausen
dc.date.accessioned2019-05-06T12:23:33Z
dc.date.available2019-05-06T12:23:33Z
dc.date.issued2010
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48332
dc.description.abstractThe observation of rapid reactions in nanoscale multilayers present challenges that require sophisticated analysis methods. We present high-resolution in situ x-ray diffraction analysis of reactions in nanoscale foils of Ni0.9V0.1-Al using the Mythen II solid-state microstrip detector system at the Material Science beamline of the Swiss Light Source Synchrotron at Paul Scherrer Institute in Villigen, Switzerland. The results reveal the temperature evolution corresponding to the rapid formation of NiAl intermetallic phase, vanadium segregation and formation of stresses during cooling, determined at high temporal (0.125 ms) and angular (0.004°) resolution over a full angular range of 120°. ABSTRACT FROM AUTHOR]en
dc.description.abstractCopyright of Applied Physics Letters is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)en
dc.sourceApplied Physics Lettersen
dc.subjectChemical reactionsen
dc.subjectIntermetallic compoundsen
dc.subjectLight sourcesen
dc.subjectMetal foilsen
dc.subjectMultilayered thin filmsen
dc.subjectNickel-aluminum alloysen
dc.subjectSynchrotron radiationen
dc.subjectX-ray diffractionen
dc.titleIn situ observation of rapid reactions in nanoscale Ni-Al multilayer foils using synchrotron radiationen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1063/1.3485673
dc.description.volume97
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.description.totalnumpages144101


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