Resistive switching phenomena in Li xCoO 2 thin films
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A substantial resistive switching of Li xCoO 2 mixed-conductor thin films is observed for the first time. The occurrence of possible bipolar switching in these oxide thin films is by current-voltage curves, investigated by conducting-probe atomic force microscopy (CP-AFM). The films are incorporated into an Au/Li xCoO 2/p++Si device and exhibit a significant resistive-switching process involving a ratio of over four orders of magnitude. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.