dc.contributor.author | Simon, J. | en |
dc.contributor.author | Langer, R. | en |
dc.contributor.author | Barski, A. | en |
dc.contributor.author | Zervos, Matthew | en |
dc.contributor.author | Pelekanos, N. T. | en |
dc.creator | Simon, J. | en |
dc.creator | Langer, R. | en |
dc.creator | Barski, A. | en |
dc.creator | Zervos, Matthew | en |
dc.creator | Pelekanos, N. T. | en |
dc.date.accessioned | 2019-05-06T12:24:36Z | |
dc.date.available | 2019-05-06T12:24:36Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48826 | |
dc.description.abstract | We show that residual doping and carrier distribution effects decrease the observed polarization-induced electric fields in GaN/AlGaN quantum wells and that these effects ought to be considered if we want to compare in a meaningful manner the experimental and theoretical polarizations in the AlGaN system. | en |
dc.language.iso | eng | en |
dc.source | Physica Status Solidi (A) Applied Research | en |
dc.title | Residual Doping Effects on the Amplitude of Polarization-Induced Electric fields in GaN/AlGaN Quantum Wells | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1002/1521-396X(200112)188:2<867 | |
dc.description.volume | 188 | |
dc.description.startingpage | 867 | |
dc.description.endingpage | 870 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
dc.type.uhtype | Article | en |
dc.contributor.orcid | Zervos, Matthew [0000-0002-6321-233X] | |
dc.description.totalnumpages | 867-870 | |
dc.gnosis.orcid | 0000-0002-6321-233X | |