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dc.contributor.authorTsokkou, D.en
dc.contributor.authorOthonos, A.en
dc.contributor.authorZervos, Matthewen
dc.creatorTsokkou, D.en
dc.creatorOthonos, A.en
dc.creatorZervos, Matthewen
dc.date.accessioned2019-05-06T12:24:45Z
dc.date.available2019-05-06T12:24:45Z
dc.date.issued2012
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48904
dc.description.abstractTHz spectroscopy has been applied to investigate the photo-induced and intrinsic conductivity in SnO 2 nanowires using the Drude-Smith model. The refractive index of the nanowires was found to decrease from 2.4 to 2.1 with increasing THz frequency and the dc mobility of the non-excited nanowires was determined to be 72 ± 10 cm 2/Vs. Measurements reveal that scattering times are carrier density dependent, while a strong suppression of long transport is evident. Intensity-dependent measurements provided an estimate of the Auger coefficient found to be γ = (7.2 ± 2.0) × 10 -31 cm 6/s. © 2012 American Institute of Physics.en
dc.language.isoengen
dc.sourceApplied Physics Lettersen
dc.subjectRefractive indexen
dc.subjectNanowiresen
dc.subjectCarrier dynamicsen
dc.subjectIntensity-dependenten
dc.subjectIntrinsic conductivityen
dc.subjectPhoto-induceden
dc.subjectTHz frequenciesen
dc.subjectThz spectroscopyen
dc.subjectTime-resolveden
dc.titleCarrier dynamics and conductivity of SnO 2 nanowires investigated by time-resolved terahertz spectroscopyen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1063/1.3698097
dc.description.volume100
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidZervos, Matthew [0000-0002-6321-233X]


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