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dc.contributor.authorLeontis, I.en
dc.contributor.authorOthonos, Andreas S.en
dc.contributor.authorNassiopoulou, Androula Galiounaen
dc.creatorLeontis, I.en
dc.creatorOthonos, Andreas S.en
dc.creatorNassiopoulou, Androula Galiounaen
dc.date.accessioned2019-12-02T15:31:41Z
dc.date.available2019-12-02T15:31:41Z
dc.date.issued2013
dc.identifier.issn1931-7573
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/58820
dc.description.abstractThe structure and light-emitting properties of Si nanowires (SiNWs) fabricated by a single-step metal-assisted chemical etching (MACE) process on highly boron-doped Si were investigated after different chemical treatments. The Si nanowires that result from the etching of a highly doped p-type Si wafer by MACE are fully porous, and as a result, they show intense photoluminescence (PL) at room temperature, the characteristics of which depend on the surface passivation of the Si nanocrystals composing the nanowires. SiNWs with a hydrogen-terminated nanostructured surface resulting from a chemical treatment with a hydrofluoric acid (HF) solution show red PL, the maximum of which is blueshifted when the samples are further chemically oxidized in a piranha solution. This blueshift of PL is attributed to localized states at the Si/SiO2 interface at the shell of Si nanocrystals composing the porous SiNWs, which induce an important pinning of the electronic bandgap of the Si material and are involved in the recombination mechanism. After a sequence of HF/piranha/HF treatment, the SiNWs are almost fully dissolved in the chemical solution, which is indicative of their fully porous structure, verified also by transmission electron microscopy investigations. It was also found that a continuous porous Si layer is formed underneath the SiNWs during the MACE process, the thickness of which increases with the increase of etching time. This supports the idea that porous Si formation precedes nanowire formation. The origin of this effect is the increased etching rate at sites with high dopant concentration in the highly doped Si material. © 2013 Leontis et al.en
dc.description.abstractlicensee Springer.en
dc.sourceNanoscale Research Lettersen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84887279685&doi=10.1186%2f1556-276X-8-383&partnerID=40&md5=6445afdc776c1702614af3b8a3ae30cc
dc.subjectStructureen
dc.subjectTransmission electron microscopyen
dc.subjectSiliconen
dc.subjectMorphologyen
dc.subjectNanowiresen
dc.subjectSilicon wafersen
dc.subjectPhotoluminescenceen
dc.subjectInterfaces (materials)en
dc.subjectRecombination mechanismsen
dc.subjectNanocrystalsen
dc.subjectStructure (composition)en
dc.subjectDopant concentrationsen
dc.subjectElectronic band gapsen
dc.subjectEtchingen
dc.subjectHydrofluoric aciden
dc.subjectInterface statesen
dc.subjectMetal-assisted chemical etchingen
dc.subjectNanostructured surfaceen
dc.subjectPorous siliconen
dc.subjectPorous silicon nanowiresen
dc.subjectSi nanowireen
dc.subjectSi nanowiresen
dc.subjectSi nanowires (SiNWs)en
dc.titleStructure, morphology, and photoluminescence of porous Si nanowires: Effect of different chemical treatmentsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1186/1556-276X-8-383
dc.description.volume8
dc.description.issue1
dc.description.startingpage1
dc.description.endingpage7
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Φυσικής / Department of Physics
dc.type.uhtypeArticleen
dc.description.notes<p>Cited By :3</p>en
dc.source.abbreviationNanoscale Res.Lett.en
dc.contributor.orcidOthonos, Andreas S. [0000-0003-0016-9116]
dc.gnosis.orcid0000-0003-0016-9116


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