Browsing Τμήμα Πληροφορικής / Department of Computer Science by Author "Noltsis, Michail"
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Conference Object
Fast Estimations of Failure Probability Over Long Time Spans
Noltsis, Michail; Englezakis, Panayiotis; Maragkoudaki, Eleni; Nicopoulos, Chrysostomos; Rodopoulos, Dimitrios; Catthoor, Francky; Sazeides, Yiannakis; Zoni, Davide; Soudris, Dimitrios (Association for Computing Machinery, 2018)Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that ...
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Book Chapter
The HARPA Approach to Ensure Dependable Performance
Zompakis, Nikolaos; Noltsis, Michail; Nikolaou, Panagiota; Englezakis, Panayiotis; Hadjilambrou, Zacharias; Ndreu, Lorena; Massari, Giuseppe; Libutti, Simone; Portero, Antoni; Sassi, Federico; Bacchini, Alessandro; Nicopoulos, Chrysostomos; Sazeides, Yiannakis; Vavrik, Radim; Golasowski, Martin; Sevcik, Jiri; Kuchar, Stepan; Vondrak, Vit; Agnes, Fritsch; Cappelle, Hans; Catthoor, Francky; Fornaciari, William; Soudris, Dimitrios (Springer International Publishing, 2019)The goal of the HARPA solution is to overcome the performance variability (PV) by enabling next-generation embedded and high-performance platforms using heterogeneous many-core processors to provide cost-effectively ...
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Conference Object
HARPA: Tackling physically induced performance variability
Zompakis, Nikolaos; Noltsis, Michail; Ndreu, L.; Hadjilambrou, Zacharias; Englezakis, Panayiotis; Nikolaou, Panagiota; Portero, Antoni; Libutti, S.; Massari, Giuseppe; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Yiannakis; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, Dimitrios J. (Institute of Electrical and Electronics Engineers Inc., 2017)Continuously increasing application demands on both High Performance Computing (HPC) and Embedded Systems (ES) are driving the IC manufacturing industry on an everlasting scaling of devices in silicon. Nevertheless, ...