• Conference Object  

      Fast Estimations of Failure Probability Over Long Time Spans 

      Noltsis, Michail; Englezakis, Panayiotis; Maragkoudaki, Eleni; Nicopoulos, Chrysostomos; Rodopoulos, Dimitrios; Catthoor, Francky; Sazeides, Yiannakis; Zoni, Davide; Soudris, Dimitrios (Association for Computing Machinery, 2018)
      Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that ...
    • Book Chapter  

      The HARPA Approach to Ensure Dependable Performance 

      Zompakis, Nikolaos; Noltsis, Michail; Nikolaou, Panagiota; Englezakis, Panayiotis; Hadjilambrou, Zacharias; Ndreu, Lorena; Massari, Giuseppe; Libutti, Simone; Portero, Antoni; Sassi, Federico; Bacchini, Alessandro; Nicopoulos, Chrysostomos; Sazeides, Yiannakis; Vavrik, Radim; Golasowski, Martin; Sevcik, Jiri; Kuchar, Stepan; Vondrak, Vit; Agnes, Fritsch; Cappelle, Hans; Catthoor, Francky; Fornaciari, William; Soudris, Dimitrios (Springer International Publishing, 2019)
      The goal of the HARPA solution is to overcome the performance variability (PV) by enabling next-generation embedded and high-performance platforms using heterogeneous many-core processors to provide cost-effectively ...
    • Conference Object  

      HARPA: Tackling physically induced performance variability 

      Zompakis, Nikolaos; Noltsis, Michail; Ndreu, L.; Hadjilambrou, Zacharias; Englezakis, Panayiotis; Nikolaou, Panagiota; Portero, Antoni; Libutti, S.; Massari, Giuseppe; Sassi, F.; Bacchini, A.; Nicopoulos, Chrysostomos A.; Sazeides, Yiannakis; Vavrik, R.; Golasowski, M.; Sevcik, J.; Vondrak, V.; Catthoor, F.; Fornaciari, W.; Soudris, Dimitrios J. (Institute of Electrical and Electronics Engineers Inc., 2017)
      Continuously increasing application demands on both High Performance Computing (HPC) and Embedded Systems (ES) are driving the IC manufacturing industry on an everlasting scaling of devices in silicon. Nevertheless, ...