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dc.contributor.authorDialynas, G. E.en
dc.contributor.authorDeligeorgis, G.en
dc.contributor.authorZervos, Matthewen
dc.contributor.authorPelekanos, N. T.en
dc.creatorDialynas, G. E.en
dc.creatorDeligeorgis, G.en
dc.creatorZervos, Matthewen
dc.creatorPelekanos, N. T.en
dc.date.accessioned2019-05-06T12:23:31Z
dc.date.available2019-05-06T12:23:31Z
dc.date.issued2006
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48313
dc.description.abstractA theoretical investigation of the effect of polarization-induced fields on the optoelectronic properties of a 3 nm In0.2Ga0.8N/GaN single quantum well has been carried out via a self-consistent solution of Schrödinger-Poisson equations within the effective mass approximation. A pronounced, non-monotonic dependence of the threshold current density Jth on the well width has been found due to the enhanced quantum-confined Stark effect. Furthermore, the dependence of threshold current density on the value of the electric field in the well was examined. The threshold current in the 3 nm In0.2Ga0.8N/GaN well is higher by a factor of 2-5 compared to an identical well with zero internal field Eint. We show that the ability to reduce or eliminate internal fields appears attractive for the improvement of the optoelectronic properties of nitride-based laser diodes and one of achieving this is by using field-compensated quaternary InAlGaN/GaN heterostructures. © 2006 Elsevier B.V. All rights reserved.en
dc.language.isoengen
dc.sourcePhysica E: Low-Dimensional Systems and Nanostructuresen
dc.subjectApproximation theoryen
dc.subjectElectric fieldsen
dc.subjectNitridesen
dc.subjectSemiconductor quantum wellsen
dc.subjectCurrent densityen
dc.subjectInternal field effecten
dc.subjectLight polarizationen
dc.subjectNitride heterostructuresen
dc.subjectOptoelectronic propertiesen
dc.subjectQuantum well laseren
dc.titleInfluence of polarization field on the lasing properties of III-nitride quantum wellsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.physe.2005.12.153
dc.description.volume32
dc.description.startingpage558
dc.description.endingpage561
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidZervos, Matthew [0000-0002-6321-233X]
dc.description.totalnumpages558-561
dc.gnosis.orcid0000-0002-6321-233X


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